Victor M. van Santen
Karlsruher Institut für Technologie
H-index: 14
Europe-Germany
Top articles of Victor M. van Santen
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Degradation Models and Optimizations for CMOS Circuits | Victor Van Santen | 2023 | |
Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | Divya Praneetha Ravipati Victor M van Santen Sami Salamin Hussam Amrouch Preeti Ranjan Panda | 2023/7/10 |
Design Automation for Cryogenic CMOS Circuits | Victor M van Santen Marcel Walter Florian Klemme Shivendra Singh Parihar Girish Pahwa | 2023/7/9 | |
Cryogenic cmos for quantum processing: 5-nm finfet-based sram arrays at 10 k | IEEE Transactions on Circuits and Systems I: Regular Papers | Shivendra Singh Parihar Victor M van Santen Simon Thomann Girish Pahwa Yogesh Singh Chauhan | 2023/6/1 |
Characterizing BTI and HCD in 1.2 V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths | Victor M Van Santen Jose M Gata-Romero Juan Nunez Rafael Castro-Lopez Elisenda Roca | 2023/3/26 | |
Carat–a reliability analysis framework for bti-hcd aging in circuits | Solid-State Electronics | Prasad Gholve Payel Chatterjee Chaitanya Pasupuleti Hussam Amrouch Narendra Gangwar | 2023/3/1 |
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits | Victor M van Santen Florian Klemme Paul R Genssler Hussam Amrouch | 2023/10/3 | |
On the reliability of FeFET on-chip memory | IEEE Transactions on Computers | Paul R Genssler Victor M van Santen Jörg Henkel Hussam Amrouch | 2021/3/17 |
Minimizing excess timing guard banding under transistor self-heating through biasing at zero-temperature coefficient | IEEE access | Sami Salamin Victor M Van Santen Martin Rapp Jörg Henkel Hussam Amrouch | 2021/2/8 |
Fn-cacti: Advanced cacti for finfet and nc-finfet technologies | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | Divya Praneetha Ravipati Rajesh Kedia Victor M Van Santen Jörg Henkel Preeti Ranjan Panda | 2021/12/13 |
The Vital Role of Machine Learning in Developing Emerging Technologies | Victor M van Santen Florian Klemme Hussam Amrouch | 2021/1/25 | |
Reliability-driven voltage optimization for NCFET-based SRAM memory banks | Victor M van Santen Simon Thomann Yogesh S Chauchan Jörg Henkel Hussam Amrouch | 2021/4/25 | |
Thermal Management and Communication Virtualization for Reliability Optimization in MPSoCs | Dependable Embedded Systems | Victor M van Santen Hussam Amrouch Thomas Wild Jörg Henkel Andreas Herkersdorf | 2021 |
Special session: Machine learning for semiconductor test and reliability | Hussam Amrouch Animesh Basak Chowdhury Wentian Jin Ramesh Karri Farshad Khorrami | 2021/4/25 | |
Self-heating effects from transistors to gates | Victor M van Santen Linda Schillinger Hussam Amrouch | 2021/4/19 | |
Massively parallel circuit setup in gpu-spice | IEEE Transactions on Computers | Victor M van Santen Fu Lam Florian Diep Jörg Henkel Hussam Amrouch | 2020/10/19 |
Bti and hcd degradation in a complete 32× 64 bit sram array–including sense amplifiers and write drivers–under processor activity | Victor M van Santen Simon Thomann Chaitanya Pasupuleti Paul R Genssler Narendra Gangwar | 2020/4/28 | |
Impact of self-heating on performance, power and reliability in finfet technology | Victor M van Santen Paul R Genssler Om Prakash Simon Thomann Jörg Henkel | 2020/1/13 | |
NCFET to rescue technology scaling: Opportunities and challenges | Hussam Amrouch Victor M van Santen Girish Pahwa Yogesh Chauhan Jörg Henkel | 2020/1/13 | |
Modeling emerging technologies using machine learning: Challenges and opportunities | Florian Klemme Jannik Prinz Victor M van Santen Jörg Henkel Hussam Amrouch | 2020/11/2 |
Co-Authors
