javier martin-martinez
Universidad Autónoma de Barcelona
H-index: 22
Europe-Spain
Top articles of javier martin-martinez
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Assessment of the variability of the IV characteristic of HfO2-based resistive switching devices and its simulation using the quasi-static memdiode model | Solid-State Electronics | E Salvador MB Gonzalez F Campabadal J Martin-Martinez R Rodriguez | 2023/8/1 |
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices | FV Fernandez E Roca P Sarazá J Martin-Martinez R Rodriguez | 2023/7/3 | |
Impact of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs | Solid-State Electronics | Carlos Valdivieso Albert Crespo-Yepes R Miranda D Bernal Javier Martin-Martinez | 2023/5/1 |
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability | Javier Martin-Martinez Javier Diaz-Fortuny Pablo Saraza-Canflanca Rosana Rodriguez Rafael Castro-Lopez | 2023/3/26 | |
Resistive switching like-behavior in FD-SOI Ω-gate transistors | Solid-State Electronics | Carlos Valdivieso R Rodriguez Albert Crespo-Yepes Javier Martin-Martinez M Nafria | 2023/11/1 |
Random Telegraph Noise and Bias Temperature Instabilities statistical characterization of Ω-gate FDSOI devices at low voltages | Solid-State Electronics | G Pedreira Javier Martin-Martinez Albert Crespo-Yepes E Amat R Rodriguez | 2023/11/1 |
CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging | Solid-state electronics | Albert Crespo-Yepes C Nasarre N Garsot Javier Martin-Martinez R Rodriguez | 2022/5/1 |
Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs | Solid-State Electronics | Carlos Valdivieso Albert Crespo-Yepes R Miranda D Bernal Javier Martin-Martinez | 2022/8/1 |
Stochastic resonance effect in binary STDP performed by RRAM devices | Emili Salvador Rosana Rodriguez Javier Martin-Martinez Albert Crespo-Yepes Enrique Miranda | 2022/7/4 | |
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation | Pablo Saraza-Canflanca Javier Martín-Martínez Elisenda Roca Rafael Castro-López Rosana Rodríguez | 2022/6/12 | |
Beneficial role of noise in hf-based memristors | Rosana Rodriguez Javier Martin-Martinez Emili Salvador Albert Crespo-Yepes Enrique Miranda | 2022/5/27 | |
On the impact of the biasing history on the characterization of random telegraph noise | IEEE Transactions on Instrumentation and Measurement | Pablo Saraza-Canflanca Rafael Castro-Lopez Elisenda Roca Javier Martin-Martinez Rosana Rodriguez | 2022/5/27 |
Determination of the time constant distribution of a defect-centric time-dependent variability model for sub-100-nm FETs | IEEE Transactions on Electron Devices | Pablo Saraza-Canflanca Rafael Castro-Lopez Elisenda Roca Javier Martin-Martinez R Rodriguez | 2022/8/25 |
Combined effects of BTI, HCI and OFF-State MOSFETs Aging on the CMOS Inverter Performance | A Crespo-Yepes C Nasarre N Garsot J Martin-Martinez R Rodriguez | 2021/9/1 | |
Unified RTN and BTI statistical compact modeling from a defect-centric perspective | Solid-State Electronics | G Pedreira Javier Martin-Martinez Pablo Saraza-Canflanca Rafael Castro-Lopez R Rodriguez | 2021/11/1 |
Simulating the impact of random telegraph noise on integrated circuits | Pablo Saraza-Canflanca Eros Camacho-Ruiz Rafael Castro-Lopez Elisenda Roca Javier Martin-Martinez | 2021/7/19 | |
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions | Solid-State Electronics | Javier Diaz-Fortuny Pablo Saraza-Canflanca Rosana Rodriguez Javier Martin-Martinez Rafael Castro-Lopez | 2021/11/1 |
Statistical characterization of time-dependent variability defects using the maximum current fluctuation | IEEE Transactions on Electron Devices | Pablo Saraza-Canflanca Javier Martín-Martínez Rafael Castro-Lopez Elisenda Roca R Rodriguez | 2021/6/17 |
SPICE modeling of cycle-to-cycle variability in RRAM devices | Solid-State Electronics | E Salvador MB Gonzalez Francesca Campabadal Javier Martin-Martinez R Rodriguez | 2021/11/1 |
Circuit reliability prediction: challenges and solutions for the device time-dependent variability characterization roadblock | M Nafria J Diaz-Fortuny P Saraza-Canflanca J Martin-Martinez Elisenda Roca | 2021/4/19 |
