Francisco Fernandez
Universidad de Sevilla
H-index: 37
Europe-Spain
Top articles of Francisco Fernandez
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging | AEU-International Journal of Electronics and Communications | A Santana-Andreo P Saraza-Canflanca R Castro-Lopez Elisenda Roca FV Fernandez | 2024/3/1 |
PACOSYT: A passive component synthesis tool based on machine learning and tailored modeling strategies towards optimal RF and mm-wave circuit designs | IEEE Journal of Microwaves | Fábio Passos Nuno Lourenço Elisenda Roca Ricardo Martins Rafael Castro-López | 2023/1/31 |
A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array | A Santana-Andreo P Saraza-Canflanca H Carrasco-Lopez R Castro-Lopez E Roca | 2023/7/3 | |
A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF | FJ Rubio-Barbero E Camacho-Ruiz R Castro-Lopez E Roca FV Fernandez | 2023/7/3 | |
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices | FV Fernandez E Roca P Sarazá J Martin-Martinez R Rodriguez | 2023/7/3 | |
Design considerations for a CMOS 65-nm RTN-based PUF | E Camacho-Ruiz FJ Rubio-Barbero R Castro-Lopez E Roca FV Fernandez | 2023/7/3 | |
A Test Module for Aging Characterization of Digital Circuits | JM Gata-Romero A Santana-Andreo E Roca R Castro-Lopez FV Fernandez | 2023/7/3 | |
Reliability evaluation of IC Ring Oscillator PUFs | JM Gata-Romero E Roca J Núñez R Castro-López FV Fernández | 2023/7/3 | |
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability | Javier Martin-Martinez Javier Diaz-Fortuny Pablo Saraza-Canflanca Rosana Rodriguez Rafael Castro-Lopez | 2023/3/26 | |
On the impact of the biasing history on the characterization of random telegraph noise | IEEE Transactions on Instrumentation and Measurement | Pablo Saraza-Canflanca Rafael Castro-Lopez Elisenda Roca Javier Martin-Martinez Rosana Rodriguez | 2022/5/27 |
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation | Pablo Saraza-Canflanca Javier Martín-Martínez Elisenda Roca Rafael Castro-López Rosana Rodríguez | 2022/6/12 | |
Determination of the time constant distribution of a defect-centric time-dependent variability model for sub-100-nm FETs | IEEE Transactions on Electron Devices | Pablo Saraza-Canflanca Rafael Castro-Lopez Elisenda Roca Javier Martin-Martinez R Rodriguez | 2022/8/25 |
A smart SRAM-Cell array for the experimental study of variability phenomena in CMOS technologies | Pablo Saraza-Canflanca Héctor Carrasco-Lopez Andrés Santana-Andreo Javier Diaz-Fortuny Rafael Castro-López | 2022/3/27 | |
Addressing a New Class of Multi-Objective Passive Device Optimization for Radiofrequency Circuit Design | Electronics | Fabio Passos Elisenda Roca Rafael Castro-López Francisco V Fernández | 2022/8/22 |
Machine Learning Approaches for Transformer Modeling | Fábio Passos Nuno Lourenço Ricardo Martins Elisenda Roca Rafael Castro-López | 2022/6/12 | |
Characterizing Aging Degradation of Integrated Circuits with a Versatile Custom Array of Reliability Test Structures | A Santana-Andreo P Martin-Lloret Elisenda Roca R Castro-Lopez Francisco V Fernandez | 2022/3/21 | |
High-level design of a novel PUF based on RTN | Eros Camacho-Ruiz Rafael Castro-López Elisenda Roca Francisco V Fernandez | 2022/6/12 | |
A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs | Integration | Andrés Santana-Andreo Pablo Saraza-Canflanca Héctor Carrasco-Lopez Piedad Brox Rafael Castro-López | 2022/7/1 |
On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUF | Eros Camacho-Ruiz Andrés Santana-Andreo Rafael Castro-López Elisenda Roca Francisco V Fernández | 2022/6/12 | |
Impact of BTI and HCI on the reliability of a Majority Voter | Andrés Santana-Andreo Elisenda Roca Rafael Castro-López Francisco V Fernández | 2022/6/12 |
Co-Authors
