Nagarajan Raghavan
Singapore University of Technology and Design
H-index: 33
Asia-Singapore
Top articles of Nagarajan Raghavan
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Materials Informatics Approach to Cu/Nb Nanolaminate Microstructure Correlations with Yield Strength and Electrical Conductivity | MATERIALS TRANSACTIONS | Takayuki Shiraiwa Koki Yasuda Fabien Briffod Mark Jhon Fergyanto Gunawan | 2024 |
Hardware implementation of memristor-based artificial neural networks | Fernando Aguirre Abu Sebastian Manuel Le Gallo Wenhao Song Tong Wang | 2024/3/4 | |
Statistical modeling of degradation behavior in Split-Gate Non-Volatile memory devices | Solid-State Electronics | S Mei L Luo K Shubhakar N Raghavan KL Pey | 2024/1/1 |
Revolutionizing Electromagnetic Materials: Machine Learning Enabled Optimization of Polymer Nanocomposites for Enhanced Performance | Advanced Engineering Materials | Pritom Jyoti Bora Bibhusita Mahanta Nagarajan Raghavan | 2024/1/26 |
Enhancement of the mechanical properties in ultra-low weight SWCNT sandwiched PDMS composites using a novel stacked architecture | Scientific Reports | Pavithra Ananthasubramanian Rahul Sahay Nagarajan Raghavan | 2024/2/23 |
Modelling of aero-mechanical response of wind turbine blade with damages by Computational Fluid Dynamics, Finite Element Analysis and Bayesian Network | Renewable Energy | My Ha Dao Quang Tuyen Le Xiang Zhao Ooi Chin Chun Luu Trung Pham Duong | 2024/4/30 |
Technological trajectory in fuel cell technologies: A patent-based main path analysis | International Journal of Hydrogen Energy | Fang Han Sejun Yoon Nagarajan Raghavan Bin Yang Hyunseok Park | 2024/1/2 |
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators | IEEE Transactions on Device and Materials Reliability | Tommaso Zanotti Alok Ranjan Sean J O’Shea Nagarajan Raghavan Ramesh Thamankar | 2024/4/29 |
Exploring Conductive Filler‐Embedded Polymer Nanocomposite for Electrical Percolation via Electromagnetic Shielding‐Based Additive Manufacturing | Nilam Qureshi Vivek Dhand Shaik Subhani Rajendran Senthil Kumar Nagarajan Raghavan | 2024 | |
Estimating the Number of Defects in a Single Breakdown Spot of a Gate Dielectric | IEEE Electron Device Letters | A Ranjan A Padovani B Dianat N Raghavan KL Pey | 2024/3/14 |
Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation | J Tan JH Lim Jae Hyun Kwon Vinayak Bharat Naik Nagarajan Raghavan | 2023/3/26 | |
Thermal simulations of lock-in-thermography for failure analysis of integrated circuits | Wen Qiu Bernice Zee Kin Leong Pey Nagarajan Raghavan | 2023/7/24 | |
Electrical Stress Induced Breakdown and Post Breakdown Physical Analysis of Mica Based Nano Capacitors | Anirudh Maruvada Sean J O’Shea Jie Deng Shubhakar Kalya Nagarajan Raghavan | 2023/10/22 | |
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices | Tiang Teck Tan Yu-Yun Wang Joel Tan Tian-Li Wu Nagarajan Raghavan | 2023/3/26 | |
Bayesian Network Modelling of Aero-Mechanical Performance of Wind Turbine | My Ha Dao Quang Tuyen Le Xiang Zhao Chin Chun Ooi Trung Pham Duong Luu | 2023/6/11 | |
Remaining Useful Life Estimation of Lithium-Ion Batteries Via Hyperparameter Optimized Bi-Long Short-Term Memory Recurrent Neural Networks | Arijit Guha Amit Patra KV Vaisakh | 2017/1/4 | |
Molecular bridges link monolayers of hexagonal boron nitride during dielectric breakdown | ACS Applied Electronic Materials | Alok Ranjan Sean J O’Shea Andrea Padovani Tong Su Paolo La Torraca | 2023/2/9 |
Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction | Microelectronic Engineering | Etienne Navarro Thomas W Cornelius Henry Proudhon Rahul Sahay Ihor Radchenko | 2023/5/1 |
Reliability Analysis of Random Telegraph Noisebased True Random Number Generators | Tommaso Zanotti Alok Ranjan Sean J O’Shea Nagarajan Raghavan Ramesh Thamankar | 2023/10/8 | |
Investigating Knowledge Structure and Future Directions in IT-Based Business Methods Using Hierarchical Main Path Approach | IEEE Access | Sejun Yoon Nagarajan Raghavan Nguyen-Truong Le Hyunseok Park | 2023/11/28 |
Co-Authors
