Luca LARCHER
Università degli Studi di Modena e Reggio Emilia
H-index: 53
Europe-Italy
Top articles of Luca LARCHER
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Device‐to‐materials pathway for electron traps detection in amorphous GeSe‐based selectors | Advanced Electronic Materials | Amine Slassi Linda‐Sheila Medondjio Andrea Padovani Francesco Tavanti Xu He | 2023/4 |
A Multiscale-Multiphysics simulation platform for technology virtualization: from process chamber modeling to device electrical prediction | L Larcher F Nardi V Milo U Kelkar P Stout | 2023/10/22 | |
Supporting Information for Adv. Electron. Mater | Amine Slassi Linda-Sheila Medondjio Andrea Padovani Francesco Tavanti Xu He | 2023 | |
Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND | Milan Pesic Bastien Beltrando Tommaso Rollo Cristian Zambelli Andrea Padovani | 2023/3/26 | |
Electrically active defects in Al2O3-InGaAs MOS stacks at cryogenic temperatures | Paolo La Torraca Andrea Padovani Lars-Erik Wernersson Karim Cherkaoui Paul Hurley | 2023/10/8 | |
Impact of Poly-Si channel: Multiscale modeling insight from first-principles to device simulation | APS March Meeting Abstracts | Rita Maji Tommaso Rollo Shruba Gangopadhyay Milan Pesic Luca Larcher | 2023 |
Towards a universal model of dielectric breakdown | Andrea Padovani Paolo La Torraca Jack Strand Alexander Shluger Valerio Milo | 2023/3/26 | |
Modeling Degradation and Breakdown in SiO2 and High-k Gate Dielectrics | Andrea Padovani Paolo La Torraca Luca Larcher Jack Strand Alexander Shluger | 2023/9/27 | |
Impact of Device Geometry, Physical Doping and Electrostatic Doping on the Frequency CV-dispersion of TFT Devices with IWO Channels | Andrea Palmieri Karim Cherkaoui Khandker Akif Aabrar Yaoqiao Hu Luca Larcher | 2023/3/7 | |
High-k/InGaAs interface defects at cryogenic temperature | Solid-State Electronics | Karim Cherkaoui P La Torraca J Lin N Maraviglia A Andersen | 2023/9/1 |
Controlling positive feedback in filamentary | 2023/12/19 | ||
Amplifier for driving a capacitive load | 2023/2/21 | ||
Simulation of atomistic defects in nanoelectronics using polyhedral meshes | 2023/8/17 | ||
The Role of Carrier Injection in the Breakdown Mechanism of Amorphous Al2O3 Layers | IEEE Electron Device Letters | P La Torraca A Padovani J Strand A Shluger L Larcher | 2023/11/30 |
A HydroDynamic model for trap-assisted tunneling conduction in ovonic devices | IEEE Transactions on Electron Devices | F Buscemi E Piccinini L Vandelli F Nardi A Padovani | 2023/2/9 |
Controlling positive feedback in filamentary RRAM structures | 2022/5/3 | ||
The electrons' journey in thick metal oxides | Applied Physics Letters | Francesco Caruso Paolo La Torraca Luca Larcher Graziella Tallarida Sabina Spiga | 2022/7/4 |
Investigation of Coercive Field Shift During Cycling in HfZrOₓ Ferroelectric Capacitors | IEEE Transactions on Electron Devices | Puyang Cai Hao Li Zhiwei Liu Tianxiang Zhu Min Zeng | 2022/4/6 |
Dielectric breakdown in HfO2 dielectrics: Using multiscale modeling to identify the critical physical processes involved in oxide degradation | Journal of Applied Physics | Jack Strand Paolo La Torraca Andrea Padovani Luca Larcher Alexander L Shluger | 2022/6/21 |
Electron-assisted switching in FeFETs: Memory window dynamics–retention–trapping mechanisms and correlation | Milan Pešić Bastien Beltrando Andrea Padovani Toshihiko Miyashita Nam-Sung Kim | 2022/3/27 |
