ProfessorsProfessors of Singapore University of Technology and DesignKalya Shubhakar

Kalya Shubhakar

Singapore University of Technology and Design

H-index: 14

Asia-Singapore

About Kalya Shubhakar

Kalya Shubhakar, With an exceptional h-index of 14 and a recent h-index of 10 (since 2020), a distinguished researcher at Singapore University of Technology and Design, specializes in the field of High-k dielectrics, Nanoscale characterization..

His recent articles reflect a diverse array of research interests and contributions to the field:

Statistical modeling of degradation behavior in Split-Gate Non-Volatile memory devices

Dielectric breakdown of 2D muscovite mica

Silicon-Controlled Rectifier Embedded Diode for 7 nm FinFET Process Electrostatic Discharge Protection

Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device

Random Telegraph Noise Nano-Spectroscopy in High-κ Dielectrics Using Scanning Probe Microscopy Techniques

Kalya Shubhakar Information

University	Singapore University of Technology and Design
Position	___
Citations(all)	602
Citations(since 2020)	317
Cited By	434
hIndex(all)	14
hIndex(since 2020)	10
i10Index(all)	20
i10Index(since 2020)	10
Email	Access Email
University Profile Page	Singapore University of Technology and Design
Google Scholar	View Google Scholar Profile

Kalya Shubhakar Skills & Research Interests

High-k dielectrics

Nanoscale characterization.

Top articles of Kalya Shubhakar

Title	Journal	Author(s)	Publication Date
Statistical modeling of degradation behavior in Split-Gate Non-Volatile memory devices	Solid-State Electronics	S Mei L Luo K Shubhakar N Raghavan KL Pey	2024/1/1
Dielectric breakdown of 2D muscovite mica	Scientific reports	Anirudh Maruvada Kalya Shubhakar Nagarajan Raghavan Kin Leong Pey Sean J O’Shea	2022/8/18
Silicon-Controlled Rectifier Embedded Diode for 7 nm FinFET Process Electrostatic Discharge Protection	Nanomaterials	Xinyu Zhu Shurong Dong Fangjun Yu Feifan Deng Kalya Shubhakar ...	2022/5/19
Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device		Laiqiang Luo Kalya Shubhakar Sen Mei Nagarajan Raghavan Fan Zhang ...	2020/4/28
Random Telegraph Noise Nano-Spectroscopy in High-κ Dielectrics Using Scanning Probe Microscopy Techniques	Noise in Nanoscale Semiconductor Devices	Alok Ranjan Nagarajan Raghavan Kalya Shubhakar Sean Joseph O’Shea Kin Leong Pey	2020