Arthur Witulski

Arthur Witulski

Vanderbilt University

H-index: 43

North America-United States

About Arthur Witulski

Arthur Witulski, With an exceptional h-index of 43 and a recent h-index of 23 (since 2020), a distinguished researcher at Vanderbilt University, specializes in the field of radiation effects on electronics, power electronics, power semiconductor devices, radiation reliability.

His recent articles reflect a diverse array of research interests and contributions to the field:

Single-Event Effects in Heavy-Ion Irradiated 3kV SiC Charge-Balanced Power Devices

LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices

Low-energy ion-induced single-event burnout in gallium oxide Schottky diodes

Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator’s Radiation Failure Probabilities

Influence of Radiation Environment Variability on Cumulative Heavy-Ion-Induced Leakage Current in SiC Power Devices

Impact of heavy-ion range on single-event effects in silicon carbide power junction barrier Schottky diodes

Methodology for Correlating Historical Degradation Data to Radiation-Induced Degradation System Effects in Small Satellites

Systematic Propagation of Component-Level Failure Effects for Spacecraft Reliability Evaluation

Arthur Witulski Information

University

Position

Research Professor Electrical Engineering

Citations(all)

7491

Citations(since 2020)

2751

Cited By

5684

hIndex(all)

43

hIndex(since 2020)

23

i10Index(all)

94

i10Index(since 2020)

51

Email

University Profile Page

Vanderbilt University

Google Scholar

View Google Scholar Profile

Arthur Witulski Skills & Research Interests

radiation effects on electronics

power electronics

power semiconductor devices

radiation reliability

Top articles of Arthur Witulski

Title

Journal

Author(s)

Publication Date

Single-Event Effects in Heavy-Ion Irradiated 3kV SiC Charge-Balanced Power Devices

IEEE Transactions on Nuclear Science

A Sengupta

DR Ball

S Islam

AS Senarath

AL Sternberg

...

2024/3/26

LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices

IEEE Transactions on Nuclear Science

Arijit Sengupta

Dennis R Ball

Andrew L Sternberg

Sajal Islam

Aditha S Senarath

...

2024/1/23

Low-energy ion-induced single-event burnout in gallium oxide Schottky diodes

IEEE Transactions on Nuclear Science

RM Cadena

DR Ball

EX Zhang

S Islam

A Senarath

...

2023/1/18

Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator’s Radiation Failure Probabilities

IEEE Transactions on Nuclear Science

Richard H Nederlander

Arthur F Witulski

Robert A Reed

Gabor Karsai

Ray L Ladbury

...

2023/6/9

Influence of Radiation Environment Variability on Cumulative Heavy-Ion-Induced Leakage Current in SiC Power Devices

IEEE Transactions on Nuclear Science

Robert A Johnson

Arthur F Witulski

Brian D Sierawski

Dennis R Ball

Kenneth F Galloway

...

2023/3/24

Impact of heavy-ion range on single-event effects in silicon carbide power junction barrier Schottky diodes

IEEE Transactions on Nuclear Science

Arijit Sengupta

Dennis R Ball

Arthur F Witulski

En Xia Zhang

Ronald D Schrimpf

...

2023/2/3

Methodology for Correlating Historical Degradation Data to Radiation-Induced Degradation System Effects in Small Satellites

Richard H Nederlander

Arthur F Witulski

Robert A Reed

Enxia Zhang

Ronald D Schrimpf

...

2022

Systematic Propagation of Component-Level Failure Effects for Spacecraft Reliability Evaluation

M Reaz

R Alles

A Witulski

G Karsai

N Mahadevan

...

2021/5/17

Systems engineering and assurance modeling (SEAM): A web-based solution for integrated mission assurance

Facta universitatis-series: Electronics and Energetics

Kaitlyn L Ryder

Ryan Alles

Gabor Karsai

Nagabhushan Mahadevan

John W Evans

...

2021

Effects of breakdown voltage on single-event burnout tolerance of high-voltage SiC power MOSFETs

IEEE Transactions on Nuclear Science

DR Ball

KF Galloway

RA Johnson

ML Alles

AL Sternberg

...

2021/5/12

A system-level modeling approach for simulating radiation effects in successive-approximation analog-to-digital converters

IEEE Transactions on Nuclear Science

MW Rony

En Xia Zhang

Mahmud Reaz

Kan Li

Andrew Daniel

...

2021/5/6

Analysis of heavy-ion-induced leakage current in SiC power devices

IEEE Transactions on Nuclear Science

Robert A Johnson

Arthur F Witulski

Dennis R Ball

Kenneth F Galloway

Andrew L Sternberg

...

2021/12/20

Modeling COTS System TID Response With Monte Carlo Sampling and Transistor Swapping Experiments

IEEE Transactions on Nuclear Science

M Brandon Smith

Arthur F Witulski

Jeffrey S Kauppila

Andrew L Sternberg

Kaitlyn L Ryder

...

2021/4/27

System-level uncertainty quantification from component-level radiation effects

Gabor Karsai

Nag Mahadevan

Arthur F Witulski

Andrew Sternberg

Jeff Kauppila

...

2021/9/13

Online Small-Sat Knowledge Repositories and Modeling Tools for Risk Reduction and Enhanced Mission Success

Arthur Witulski

Brian Sierawski

Gabor Karsai

Nag Mahadevan

Robert Reed

...

2021

Connecting Mission Profiles and Radiation Vulnerability Assessment

Richard H Nederlande

Kaitlyn L Ryder

Arthur F Witulski

Gabor Karsai

Nag Mahadevan

...

2021/8/7

Model Based Systems Engineering for CubeSat Mission Reliability

Tatyana Rakalina

Michel Izygon

Lui Wang

Isabelle Conway

Silvana Radu

...

2021

Automatic fault tree generation from radiation-induced fault models

Rebekah A Austin

Nagabhushan Mahadevan

Arthur F Witulski

Gabor Karsai

Brian D Sierawski

...

2020/1/27

International Cooperation on Model Based Development For Spaceflight Assurance: The TACS Test Case

ESA Model Based Space Systems and Software Engineering Workshop

Isabelle Conway

Silvana Radu

ESA Lui Wang

J Evans

Naoki Ishihama

...

2020

Effective Small-Satellite Radiation Assurance for Non-Specialists

Rebekah A Austin

BD Sierawski

AF Witulski

RD Schrimpf

RA Reed

2020/8/31

See List of Professors in Arthur Witulski University(Vanderbilt University)

Co-Authors

H-index: 91
Daniel M. Fleetwood

Daniel M. Fleetwood

Vanderbilt University

H-index: 84
Ron Schrimpf

Ron Schrimpf

Vanderbilt University

H-index: 65
Lloyd Massengill

Lloyd Massengill

Vanderbilt University

H-index: 62
Robert Erickson

Robert Erickson

University of Colorado Boulder

H-index: 60
Robert A Reed

Robert A Reed

Vanderbilt University

H-index: 59
Gabor Karsai

Gabor Karsai

Vanderbilt University

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