Lloyd Massengill
Vanderbilt University
H-index: 65
North America-United States
Top articles of Lloyd Massengill
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
The Effects of Threshold Voltage and Number of Fins per Transistor on the TID Response of GF 12LP Technology | IEEE Transactions on Nuclear Science | Aldo I Vidana Nathaniel A Dodds R Nathan Nowlin Trace M Wallace Phil J Oldiges | 2024/1/26 |
Total-Ionizing-Dose Effects and Low-Frequency Noise in N-type Carbon Nanotube Field-Effect Transistors with HfO2 Gate Dielectrics | IEEE Transactions on Nuclear Science | Patrick K Darmawi-Iskandar Andrew M Aaron En Xia Zhang Bharat L Bhuva Jeffery S Kauppila | 2023/2/6 |
Analysis of Single-Event Upsets and Transients in 22 nm Fully Depleted Silicon-On-Insulator Logic | IEEE Transactions on Nuclear Science | Joseph V D’Amico Sean T Vibbert Arthur C Watkins Benjamin C Fahrenkrug Tim D Haeffner | 2023/1/18 |
On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs | IEEE Transactions on Nuclear Science | Joseph V D’Amico IV Sean T Vibbert Rick M Cadena Michael L Alles Dennis R Ball | 2023/12/14 |
Summary of Recent Total Ionizing Dose Testing on GF 12LP CMOS Technology. | Hugh Barnaby Trace Wallace Matthew J Marinella Jereme Neuendank Donald Wilson | 2022/11/1 | |
Mitigating total-ionizing-dose-induced threshold-voltage shifts using back-gate biasing in 22-nm FD-SOI transistors | IEEE Transactions on Nuclear Science | AC Watkins ST Vibbert JV D’Amico JS Kauppila TD Haeffner | 2022/1/25 |
Supply voltage dependence of ring oscillator frequencies for total ionizing dose exposures for 7-nm bulk FinFET technology | IEEE Transactions on Nuclear Science | Yoni Xiong Alexandra T Feeley Peng Fei Wang Xun Li En Xia Zhang | 2021/6/2 |
Frequency, LET, and supply voltage dependence of logic soft errors at the 7-nm node | Yoni Xiong Alexandra Feeley Lloyd W Massengill Bharat L Bhuva S-J Wen | 2021/3/21 | |
Single-event latchup in a 7-nm bulk FinFET technology | IEEE Transactions on Nuclear Science | DR Ball CB Sheets L Xu J Cao S-J Wen | 2021/1/14 |
Analysis of single-event transients (SETs) using machine learning (ML) and ionizing radiation effects spectroscopy (IRES) | IEEE Transactions on Nuclear Science | TD Loveless DR Reising JC Cancelleri LW Massengill D McMorrow | 2021/1/11 |
Single-event upsets in a 7-nm bulk FinFET technology with analysis of threshold voltage dependence | IEEE Transactions on Nuclear Science | Joseph V D’Amico Dennis R Ball Jingchen Cao Lyuan Xu Mike Rathore | 2021/1/11 |
In Situ Measurement of TID-Induced Leakage Using On-Chip Frequency Modulation | IEEE Transactions on Nuclear Science | ST Vibbert AC Watkins JV D’Amico MW McKinney DS Vibbert | 2021/12/13 |
Temperature dependence of single-event transient pulse widths for 7-nm bulk FinFET technology | Jingchen Cao Lyuan Xu S-J Wen Rita Fung Balaji Narasimham | 2020/4/28 | |
Radiation hardened by design subsampling phase-locked loop techniques in PD-SOI | IEEE Transactions on Nuclear Science | Ellis W Richards TD Loveless JS Kauppila TD Haeffner WT Holman | 2020/3/3 |
