Enrico Zanoni
Università degli Studi di Padova
H-index: 69
Europe-Italy
Top articles of Enrico Zanoni
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Semitransparent perovskite solar cells for Si tandem and agrivoltaic integration | Nicola Trivellin Noah Tormena Jasmine Jessica Nicole Barrantes Carlo De Santi Francesco Piva | 2024/3/8 | |
Undestanding commercial UVC LEDs reliability to boost disinfection efficacy | Nicola Trivellin Francesco Piva Carlo De Santi Alessandro Caria Matteo Buffolo | 2024/3/13 | |
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics | IEEE Transactions on Electron Devices | Michele Zenari Matteo Buffolo Carlo De Santi Jeroen Goyvaerts Alexander Grabowski | 2024/1/3 |
Lifetime-limiting mechanisms of integrated IR sources for silicon photonics | Matteo Buffolo Michele Zenari Carlo De Santi Chen Shang Justin Norman | 2024/3/8 | |
Physical insights into trapping effects on vertical GaN-on-Si trench MOSFETs from TCAD | Journal of Semiconductors | Nicolò Zagni Manuel Fregolent Andrea Del Fiol Davide Favero Francesco Bergamin | 2024 |
Defects, performance, and reliability in UVC LEDs | Matteo Meneghini Nicola Roccato Francesco Piva Marco Pilati Carlo De Santi | 2024/3/13 | |
Positive VTH shift in Schottky p-GaN Gate power HEMTs: Dependence on Temperature, Bias and Gate leakage | IEEE Transactions on Power Electronics | Nicola Modolo Carlo De Santi Sebastien Sicre Andrea Minetto Gaudenzio Meneghesso | 2024/2/22 |
Origin and Recovery of Negative VTH Shift on 4H–SiC MOS Capacitors: An Analysis Based on Inverse Laplace Transform and Temperature-Dependent Measurements | Materials Science in Semiconductor Processing | Alberto Marcuzzi Marina Avramenko Carlo De Santi Filip Geenen Peter Moens | 2024/7/1 |
V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis | IEEE Transactions on Electron Devices | Marco Nicoletto Alessandro Caria Fabiana Rampazzo Carlo De Santi Matteo Buffolo | 2024/1/26 |
TCAD Modeling and Simulation of Dark Current-Voltage Characteristics in High-Periodicity InGaN/GaN Multiple-Quantum-Wells (MQWs) Solar Cells | IEEE Journal of Photovoltaics | Marco Nicoletto Alessandro Caria Carlo De Santi Matteo Buffolo Matteo GC Alasio | 2024/3/19 |
Antimony selenide solar cells: non-ideal deep level response and study of trap-filling transients | Carlo De Santi Jessica Jazmine Nicole Barrantes Francesco Piva Alessandro Caria Matteo Buffolo | 2024/3/8 | |
Modeling of the electrical characteristics and degradation mechanisms of UV-C LEDs | IEEE Photonics Journal | Nicola Roccato Francesco Piva Carlo De Santi Matteo Buffolo Normal Susilo | 2024/1/18 |
Modeling of the gate leakage in MOSFETs with Al2O3/β-Ga2O3 gate stack | Carlo De Santi Manuel Fregolent Enrico Brusaterra Kornelius Tetzner Joachim Würfl | 2024/3/15 | |
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs | Marco Nicoletto Alessandro Caria Fabiana Rampazzo Carlo De Santi Matteo Buffolo | 2024/3/8 | |
Review and Outlook on GaN and SiC Power Devices: Industrial State-of-the-Art, Applications, and Perspectives | M Buffolo D Favero A Marcuzzi C De Santi G Meneghesso | 2024/1/10 | |
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress | A Caria R Fraccaroli G Pierobon T Castellaro G Mura | 2024/3/13 | |
Gate leakage modeling in lateral β-Ga2O3 MOSFETs with Al2O3 gate dielectric | Applied Physics Letters | Manuel Fregolent Enrico Brusaterra Carlo De Santi Kornelius Tetzner Joachim Würfl | 2023/9/4 |
Novel models for the analysis of the dynamic performance of wide bandgap devices | Carlo DE SANTI Manuel Fregolent Nicola Modolo Matteo Buffolo Fabiana Rampazzo | 2023 | |
Physics-based trap analysis and compact modeling performance evaluation of AlGaN/GaN HEMTs | Carlo DE SANTI Nicola Modolo Giulio Baratella Matteo Borga Niels Posthuma | 2023 | |
Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability | IEEE Transactions on Electron Devices | Enrico Zanoni Carlo De Santi Zhan Gao Matteo Buffolo Mirko Fornasier | 2023/10/9 |
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