Dr. Hajdin Ceric
Technische Universität Wien
H-index: 16
Europe-Austria
Top articles of Dr. Hajdin Ceric
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Electromigration-induced void evolution and failure of Cu/SiCN hybrid bonds | Journal of Applied Physics | Hajdin Ceric Houman Zahedmanesh Kristof Croes Roberto Lacerda de Orio Siegfried Selberherr | 2023/3/14 |
Microstructural impact on electromigration reliability of gold interconnects | Solid-State Electronics | Hajdin Ceric RL de Orio Siegfried Selberherr | 2023/2/1 |
A framework for combined simulations of electromigration induced stress evolution, void nucleation, and its dynamics: Application to nano-interconnect reliability | Journal of Applied Physics | AS Saleh K Croes H Ceric I De Wolf H Zahedmanesh | 2023/10/7 |
Statistical study of electromigration in gold interconnects | Microelectronics Reliability | Hajdin Ceric Roberto Lacerda de Orio Siegfried Selberherr | 2023/8/1 |
Impact of via geometry and line extension on via-electromigration in nano-interconnects | Ahmed S Saleh Houman Zahedmanesh Hajdin Ceric Ingrid De Wolf Kris Croes | 2023/3/26 | |
Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics | Hajdin Ceric Roberto Lacerda de Orio Siegfried Selberherr | 2022/9/19 | |
Dynamics of electromigration voids in Cu interconnects: Investigation using a physics-based model augmented by neural networks | AS Saleh Houman Zahedmanesh Hajdin Ceric Kristof Croes I De Wolf | 2022/6/27 | |
Electromigration Degradation of Gold Interconnects: A Statistical Study | Hajdin Ceric RL de Orio Siegfried Selberherr | 2022/6/27 | |
Void-dynamics in nano-wires and the role of microstructure investigated via a multi-scale physics-based model | Journal of Applied Physics | AS Saleh Hajdin Ceric H Zahednamesh | 2021/3/28 |
Modeling methods for analysis of electromigration degradation in nano-interconnects | ECS Journal of Solid State Science and Technology | Hajdin Ceric Siegfried Selberherr Houman Zahedmanesh RL de Orio Kristof Croes | 2021/3/4 |
Models and Techniques for Reliability Studies of Nano-scaled Interconnects | A} dvances in {M} easurements and {I} nstrumentation:{R} eviews} | Hajdin Ceric Houman Zahedmanesh Roberto Lacerda de Orio Siegfried Selberherr | 2021 |
