David Allred

David Allred

Brigham Young University

H-index: 27

North America-United States

About David Allred

David Allred, With an exceptional h-index of 27 and a recent h-index of 9 (since 2020), a distinguished researcher at Brigham Young University, specializes in the field of thin film, EUV, ellipsometry, space mirror, actinide.

His recent articles reflect a diverse array of research interests and contributions to the field:

Enhanced Far Ultra-Violet Optical Properties of Physical Vapor Deposited Aluminum Mirrors through Fluorination

Frequency characterization of laser microphones

Tuning the index of refraction of a polyvinyl toluene and polystyrene copolymer toward a heterogenous, index‐matched neutron detector

Aging of lithium fluoride thin films according humidity and temperature

Photodegradation of Self-Immolating Polymers as a Potential Solution to Optical Scattering

Addressing calibration of high-harmonic generation sources used for studying magnetism

Variable-angle, spectroscopic ellipsometry study on the repeated application of first contact polymer on silicon-based surfaces

Evidence of Parametrically Down-Converted Photon Pairs in the X-Ray Spectrum

David Allred Information

University

Position

___

Citations(all)

3320

Citations(since 2020)

440

Cited By

3006

hIndex(all)

27

hIndex(since 2020)

9

i10Index(all)

58

i10Index(since 2020)

9

Email

University Profile Page

Brigham Young University

Google Scholar

View Google Scholar Profile

David Allred Skills & Research Interests

thin film

EUV

ellipsometry

space mirror

actinide

Top articles of David Allred

Title

Journal

Author(s)

Publication Date

Enhanced Far Ultra-Violet Optical Properties of Physical Vapor Deposited Aluminum Mirrors through Fluorination

American Astronomical Society Meeting Abstracts

Manuel Quijada

Javier Del Hoyo

Luis Rodriguez de Marcos

Devin Lewis

Tanner Rydalch

...

2024/2

Frequency characterization of laser microphones

The Journal of the Acoustical Society of America

Carson F Cunningham

Alexandra M Hopps

Wyatt Losee

Richard Sandberg

David Allred

...

2023/3/1

Tuning the index of refraction of a polyvinyl toluene and polystyrene copolymer toward a heterogenous, index‐matched neutron detector

Journal of Applied Polymer Science

Aaron J Thorum

David D Allred

William G Pitt

Troy R Munro

2023/1/10

Aging of lithium fluoride thin films according humidity and temperature

Bulletin of the American Physical Society

Tanner Rydalch

David Allred

2023/10/20

Photodegradation of Self-Immolating Polymers as a Potential Solution to Optical Scattering

Alex Gallion

Sydney McFarland

David Allred

Walter Paxton

2023

Addressing calibration of high-harmonic generation sources used for studying magnetism

Taylor J Buckway

Aaron Redd

Devin Lewis

Eric Gullikson

Joshua Vawdrey

...

2023/10/3

Variable-angle, spectroscopic ellipsometry study on the repeated application of first contact polymer on silicon-based surfaces

Joshua J Vawdrey

James P Hamilton

David D Allred

2023/10/2

Evidence of Parametrically Down-Converted Photon Pairs in the X-Ray Spectrum

Abigail Mae Hardy

Nicholas J Hartley

Daniel Hodge

Sean Sheehan

Eric Christie

...

2023/8/14

Stability of lithium fluoride thin films as a function of humidity and temperature

Tanner D Rydalch

Devin M Lewis

David D Allred

2022/8/29

Review on adhesion of particulate contaminants on space observatories

American Astronomical Society Meeting# 240

Joshua Vawdrey

David Allred

Stuart Shaklan

2022/6

Carbon nanotube microfabricated window with extreme ultraviolet transmission and differential pumping

Scott Olsen

Richard Vanfleet

David Allred

Robert Davis

2022/10/3

Evidence that evaporated Al/AlF3 bilayer thin films stored in a 327 K oven for over 2500 hours have not degraded

Kenan Fronk

David D Allred

2022/8/31

Oxidation of aluminum thin films protected by ultrathin MgF2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

OSA Continuum

Brian I Johnson

Tahereh G Avval

R Steven Turley

Matthew R Linford

David D Allred

2021/3/15

Oxide structure of air-passivated U-6Nb alloy thin films

Journal of Nuclear Materials

Erik B Watkins

Izabela Kruk

Jaroslaw Majewski

David D Allred

2020/10/1

A carbon nanotube structure for an EUV window with differential pumping

Scott Olsen

Richard Vanfleet

David Allred

Steve Turley

Robert Davis

2020/8/21

The Dynamic Spectroscopic Ellipsometry (SE) Data for Aluminum Thin Films Oxidations

David D Allred

Tahereh G Avval

2020

Illuminating the degradation of lithium fluoride mirror coatings in humid environments

Devin M Lewis

Caleb Michael Plewe

Alexandra Gallion Stapley

Joshua J Vawdrey

R Steven Turley

...

2020/12/15

Extreme Ultraviolet Application of Carbon Nanotube Structures

Scott Olsen

Richard Vanfleet

David Allred

Steve Turley

2020

Retardation of the oxidation of aluminum thin films in low-oxygen and cryogenic environments

S Merlin Hart

Donovan K Smith

David D Allred

2020/12/13

See List of Professors in David Allred University(Brigham Young University)

Co-Authors

H-index: 52
Matthew Linford

Matthew Linford

Brigham Young University

H-index: 43
Steve Hudgens

Steve Hudgens

Santa Clara University

H-index: 34
Rajendra Singh

Rajendra Singh

Clemson University

H-index: 31
Robert Davis

Robert Davis

Brigham Young University

H-index: 23
Richard Vanfleet

Richard Vanfleet

Brigham Young University

H-index: 18
Richard Lunt Sandberg

Richard Lunt Sandberg

Brigham Young University

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