Matthew Linford
Brigham Young University
H-index: 52
North America-United States
Top articles of Matthew Linford
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters | Applied Surface Science Advances | Joshua W Pinder George H Major Donald R Baer Jeff Terry James E Whitten | 2024/2/1 |
New method for collecting XPS and other spectra: A thought (Gedanken) experiment | Hybrid Advances | Samira Jafari Gregory Snow Jeff Terry Matthew R Linford | 2024/2/27 |
A practical guide to interpreting low energy ion scattering (LEIS) spectra | Applied Surface Science | Stanislav Průša Matthew R Linford Elena Vaníčková Pavel Bábík Joshua W Pinder | 2024/6/1 |
Surface analysis insight note: An example of a cluster analysis of spectra from an X‐ray photoelectron spectroscopy image | Surface and Interface Analysis | Behnam Moeini John M Linford Neal Gallagher Matthew R Linford | 2024/2 |
A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering | Applied Surface Science | Tahereh G Avval Stanislav Průša Cody V Cushman Grant T Hodges Sarah Fearn | 2023/1/1 |
Analysis of copper metal with a K-Alpha instrument from Thermo Scientific by XPS at 60 and 200 eV pass energy | Surface Science Spectra | Annika M Dean Samira Jafari Matthew R Linford | 2023/12/1 |
Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature | Journal of Vacuum Science & Technology A | George H Major B Maxwell Clark Kevin Cayabyab Nathan Engel Christopher D Easton | 2023/7/1 |
Wire grid polarizer with multi-layer silane conformal coating | 2023/11/21 | ||
Surface analysis insight note: Multivariate curve resolution of an X‐ray photoelectron spectroscopy image | Surface and Interface Analysis | Behnam Moeini Neal Gallagher Matthew R Linford | 2023/12 |
Surface analysis insight note. Principal component analysis (PCA) of an X‐ray photoelectron spectroscopy image. The importance of preprocessing | Surface and Interface Analysis | Behnam Moeini Tahereh G Avval Neal Gallagher Matthew R Linford | 2023/11 |
Introduction to Chemical State Analysis by XPS with Examples | George H Major Neal Fairley Vincent Fernandez Matthew R Linford | 2023 | |
Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS) | Journal of Vacuum Science & Technology A | George H Major Joshua W Pinder Daniel E Austin Donald R Baer Steven L Castle | 2023/5/12 |
Area-Selective Atomic Layer Deposition of ZnO on Si\SiO2 Modified with Tris(dimethylamino)methylsilane | Materials | Behnam Moeini Tahereh G Avval Hidde H Brongersma Stanislav Průša Pavel Bábík | 2023/6/29 |
Surface analysis insight note: initial, statistical evaluation of X‐ray photoelectron spectroscopy images | Surface and Interface Analysis | Behnam Moeini Matthew R Linford | 2023/8 |
Chemical vapor deposition of thick inorganic coating on a polarizer | 2023/9/5 | ||
Microstructure quantification of oblique angle sputtered porous a-Si thin films as a basis for structure-property relations of solid phase microextraction coatings | Surface and Coatings Technology | Behnam Moeini David T Fullwood Paul Minson Daniel Shollenberger David S Bell | 2023/11/25 |
Surface analysis insight note: Analysis of X‐ray photoelectron spectroscopy images with summary statistics | Surface and Interface Analysis | Behnam Moeini Matthew R Linford | 2023/11 |
Differences Between Standard and Infrared Spectroscopic Ellipsometry | Vac. Technol. Coat | James N Hilfiker Tom Tiwald Matthew R Linford | 2023 |
Area-Selective (Inhibited) Atomic Layer Deposition of ZnO on Si/SiO2 Using Tris (trimethylamino) methylsilane | Behnam Moeini Tahereh Avval Hidde Brongersma Stanislav Průša Pavel Bábík | 2023/5/30 | |
Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer | Surface and Interface Analysis | Alvaro J Lizarbe George H Major Vincent Fernandez Neal Fairley Matthew R Linford | 2023/9 |
Co-Authors
