Yiorgos Tsiatouhas

Yiorgos Tsiatouhas

University of Ioannina

H-index: 18

Europe-Greece

About Yiorgos Tsiatouhas

Yiorgos Tsiatouhas, With an exceptional h-index of 18 and a recent h-index of 8 (since 2020), a distinguished researcher at University of Ioannina, specializes in the field of Integrated Circuit Design and Design for Testability.

His recent articles reflect a diverse array of research interests and contributions to the field:

Triple-Node-Upset Recoverable Radiation-Hardened by Design Latch

Deep Learning Based Detection of Anti-Reflective Obstacles in VLC Systems

BTI Aging Influence in SRAM-based In-Memory Computing Schemes and its Mitigation

Embedded Platforms for Trusted Edge Computing Towards Quality Assurance Along the Supply Chain

BTI Aging Influence and Mitigation in Neural Networks Oriented In-Memory Computing SRAMs

SiCBit-PUF: Strong in-Cache Bitflip PUF Computation for Trusted SoCs

An aging monitoring scheme for SRAM decoders

Matteo Sonza Reorda Mircea Stan Stephen Sunter Mottaqiallah Taouil Atul Thakur

Yiorgos Tsiatouhas Information

University

Position

___

Citations(all)

1208

Citations(since 2020)

357

Cited By

977

hIndex(all)

18

hIndex(since 2020)

8

i10Index(all)

39

i10Index(since 2020)

6

Email

University Profile Page

University of Ioannina

Google Scholar

View Google Scholar Profile

Yiorgos Tsiatouhas Skills & Research Interests

Integrated Circuit Design and Design for Testability

Top articles of Yiorgos Tsiatouhas

Title

Journal

Author(s)

Publication Date

Triple-Node-Upset Recoverable Radiation-Hardened by Design Latch

Evangelos Paparsenos

Yiorgos Tsiatouhas

2024/3/28

Deep Learning Based Detection of Anti-Reflective Obstacles in VLC Systems

Marina E Plissiti

Christoforos Papaioannou

Yiorgos Sfikas

Georgios Papatheodorou

Simon-Ilias Poulis

...

2024/2/19

BTI Aging Influence in SRAM-based In-Memory Computing Schemes and its Mitigation

Christina Dilopoulou

Yiorgos Tsiatouhas

2023/12/4

Embedded Platforms for Trusted Edge Computing Towards Quality Assurance Along the Supply Chain

Vasileios Tenentes

Athanasios Xynos

Christos Zonios

Asimina Koutra

Christina Dilopoulou

...

2023/11/10

BTI Aging Influence and Mitigation in Neural Networks Oriented In-Memory Computing SRAMs

Christina Dilopoulou

Yiorgos Tsiatouhas

2023/6/28

SiCBit-PUF: Strong in-Cache Bitflip PUF Computation for Trusted SoCs

Athanasios Xynos

Vasileios Tenentes

Yiorgos Tsiatouhas

2023/5/22

An aging monitoring scheme for SRAM decoders

Integration

Helen-Maria Dounavi

Yiorgos Tsiatouhas

2023/1/1

Matteo Sonza Reorda Mircea Stan Stephen Sunter Mottaqiallah Taouil Atul Thakur

Journal of Electronic Testing

Abhrajit Sengupta

Amin Shafiee

Ambika Prasad Shah

Youhua Shi

Tom Sikina

...

2022

Experimental Evaluation of a Euclidean Distances based 3-Color Shift Keying Scheme for Visible Light Communications

Georgios Megas

Georgios Papatheodorou

Yiorgos Sfikas

Aristides Efthymiou

Yiorgos Tsiatouhas

2022/12/2

Efficient Dynamic Logic Magnitude Comparators

Constantinos Efstathiou

Laura Agalioti

Yiorgos Tsiatouhas

2022/10/3

BTI Aging Influence on Charge Pump Circuits

Spyridon Spyridonos

Yiorgos Tsiatouhas

2022/6/8

Signal decoding in an NLOS VLC system with the presence of anti-reflective obstacles

Christoforos Papaioannou

Marina E Plissiti

Yiorgos Sfikas

Georgios Papatheodorou

Simon-Ilias Poulis

...

2022/6/6

Effective current pre-amplifiers for visible light communication (VLC) receivers

Technologies

Simon-Ilias Poulis

Georgios Papatheodorou

Christoforos Papaioannou

Yiorgos Sfikas

Marina E Plissiti

...

2022/2/21

An efficient adaptive thresholding scheme for signal decoding in NLOS VLC systems

Marina E Plissiti

Christoforos Papaioannou

Yiorgos Sfikas

Georgios Papatheodorou

Simon-Ilias Poulis

...

2021/9/7

A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs

Journal of Electronic Testing

Vasileios Gerakis

Yiorgos Tsiatouhas

Alkis Hatzopoulos

2021/4

Aging prediction and tolerance for the SRAM memory cell and sense amplifier

Journal of Electronic Testing

Helen-Maria Dounavi

Yiorgos Sfikas

Yiorgos Tsiatouhas

2021/2

Monitoring of BTI and HCI Aging in SRAM Decoders

Helen-Maria Dounavi

Yiorgos Tsiatouhas

2020/5/25

Aging Monitors for SRAM Memory Cells and Sense Amplifiers

Ageing of Integrated Circuits: Causes, Effects and Mitigation Techniques

Helen-Maria Dounavi

Yiorgos Sfikas

Yiorgos Tsiatouhas

2020

An alternative post-bond testing method for TSVs

Vasileios Gerakis

Yiorgos Tsiatouhas

Alkis Hatzopoulos

2020/9/7

See List of Professors in Yiorgos Tsiatouhas University(University of Ioannina)

Co-Authors

H-index: 43
Said Hamdioui

Said Hamdioui

Technische Universiteit Delft

H-index: 8
Zaher Owda

Zaher Owda

Universität Siegen

H-index: 6
John Liaperdos

John Liaperdos

University of Peloponnese

H-index: 5
Sotiris Matakias

Sotiris Matakias

National and Kapodistrian University of Athens

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