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Woo-Shik Jung

Woo-Shik Jung

Stanford University

H-index: 18

North America-United States

About Woo-Shik Jung

Woo-Shik Jung, With an exceptional h-index of 18 and a recent h-index of 13 (since 2020), a distinguished researcher at Stanford University, specializes in the field of Solid State Electronic Devices.

His recent articles reflect a diverse array of research interests and contributions to the field:

Gate-Controlled Charge Modulated Device for CMOS Image Sensors

Reduction of surface roughness in epitaxially grown germanium by controlled thermal oxidation

Woo-Shik Jung Information

University

Position

Electrical Engineering

Citations(all)

1658

Citations(since 2020)

862

Cited By

1204

hIndex(all)

18

hIndex(since 2020)

13

i10Index(all)

23

i10Index(since 2020)

14

Email

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University Profile Page

Stanford University

Google Scholar

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Woo-Shik Jung Skills & Research Interests

Solid State Electronic Devices

Top articles of Woo-Shik Jung

Title

Journal

Author(s)

Publication Date

Gate-Controlled Charge Modulated Device for CMOS Image Sensors

2018/10/23

Reduction of surface roughness in epitaxially grown germanium by controlled thermal oxidation

2020/3/24

See List of Professors in Woo-Shik Jung University(Stanford University)