Valeriya Kilchytska
Université Catholique de Louvain
H-index: 29
Europe-Belgium
Top articles of Valeriya Kilchytska
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Impact of thermal coupling effects on the digital and analog figures of merit of UTBB SOI MOSFET pairs | Solid-State Electronics | Martin Vanbrabant Jean-Pierre Raskin Denis Flandre Valeriya Kilchytska | 2023/4/1 |
Variance and Skewness of Current Fluctuations Experimentally Evidenced in Single-Photon Avalanche Diodes | Léopold Van Brandt Roselien Vercauteren Diego Haya Enriquez Nicolas André Valeriya Kilchytska | 2023/10/17 | |
Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack | Solid-State Electronics | Yiyi Yan Valeriya Kilchytska Denis Flandre Jean-Pierre Raskin | 2023/9/1 |
Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs | Solid-State Electronics | Arka Halder Lucas Nyssens Dimitri Lederer Valeriya Kilchytska Jean-Pierre Raskin | 2023/9/1 |
Improved self-heating extraction with RF technique at cryogenic temperatures | Solid-State Electronics | Martin Vanbrabant Jean-Pierre Raskin Valeriya Kilchytska | 2023/9/1 |
Impact of High Temperature Up to 175 C on the DC and RF Performances of 22-nm FD-SOI MOSFETs | IEEE Transactions on Electron Devices | Arka Halder Lucas Nyssens Martin Vanbrabant Martin Rack Dimitri Lederer | 2023/8/15 |
Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors | Microelectronic Engineering | Yiyi Yan Valeriya Kilchytska Bin Wang Sébastien Faniel Yun Zeng | 2022/2/1 |
22 nm FD-SOI MOSFET figures of merit at high temperatures upto 175° C | Arka Halder Lucas Nyssens Martin Rack Dimitri Lederer Valeriya Kilchytska | 2022/1/16 | |
Experimental study of thermal coupling effects in FD-SOI MOSFET | Solid-State Electronics | Martin Vanbrabant Jean-Pierre Raskin Denis Flandre Valeriya Kilchytska | 2022/8/1 |
Hexagonal Boron Nitride Memristor Based on a Nanogap Self-Formed by Silicidation | Yiyi Yan Nicolas Reckinger Valeriya Kilchytska Denis Flandre Xiaohui Tang | 2022 | |
Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method | Solid-State Electronics | Yiyi Yan Valeriya Kilchytska Denis Flandre Jean-Pierre Raskin | 2022/8/1 |
Characteristics of noise degradation and recovery in gamma-irradiated SOI nMOSFET with in-situ thermal annealing | Solid-State Electronics | Sedki Amor Valeriya Kilchytska Fares Tounsi Nicolas André M Machhout | 2022/8/1 |
Back-gate lumped resistance effect on AC characteristics of FD-SOI MOSFET | IEEE Microwave and Wireless Components Letters | Martin Vanbrabant Lucas Nyssens Valeriya Kilchytska Jean-Pierre Raskin | 2022/4/8 |
Trap recovery by in-situ annealing in fully-depleted MOSFET with active silicide resistor | IEEE Electron Device Letters | Sedki Amor Valeriya Kilchytska Denis Flandre Philippe Galy | 2021/5/11 |
Extensive electrical characterization methodology of advanced MOSFETs towards analog and RF applications | Valeriya Kilchytska Sergej Makovejev Babak Kazemi Esfeh Lucas Nyssens Arka Halder | 2021/2/8 | |
Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI | Lucas Nyssens Martin Rack Arka Halder Martin Vanbrabant Valeriya Kilchytska | 2021/4/19 | |
A physical model of contact resistance in Ti-contacted graphene-based field effect transistors | IEEE Transactions on Electron Devices | Bin Wang Mohammad Wasil Malik Yiyi Yan Valeriya Kilchytska Yun Zeng | 2021/1/8 |
Assessment of RF compact modelling of FD SOI transistors | Martin Vanbrabant Lucas Nyssens Valeriya Kilchytska Jean-Pierre Raskin | 2021/4/19 | |
Advanced MOSFETs Electrical Characterization for Further Analog and RF applications | Valeriya Kilchytska Sergei Makovejev Babak Kazemi Esfeh Lucas Nyssens Arka Halder | 2021 | |
Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack | Yiyi Yan Denis Flandre Valeriya Kilchytska Sébastien Faniel Xiaohui Tang | 2021/4/19 |
