Tomonori Honda, PhD
Massachusetts Institute of Technology
H-index: 14
North America-United States
Top articles of Tomonori Honda, PhD
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Wafer Bin Map Based Root Cause Analysis | 2023/9/19 | ||
Rational decision-making tool for semiconductor processes | 2023/10/3 | ||
Anomalous equipment trace detection and classification | 2023/3/21 | ||
ML-assisted IC Test Binning with Real-Time Prediction at the Edge | Tomonori Honda Thijs Haarhuis Jeffrey D David Henri Hannink Greg Prewitt | 2023/3/7 | |
Maintenance scheduling for semiconductor manufacturing equipment | 2022/4/5 | ||
Sequenced Approach For Determining Wafer Path Quality | 2022/3/3 | ||
Semiconductor yield prediction | 2021/6/1 | ||
Machine learning variable selection and root cause discovery by cumulative prediction | 2021/4/22 | ||
Collaborative learning model for semiconductor applications | 2021/4/22 | ||
Abnormal Wafer Image Classification | 2021/10/28 | ||
Applications for Machine Learning in Semiconductor Manufacturing | Chen He Hanbin Hu Peng Li | 2021/4/8 | |
Failure detection and classsification using sensor data and/or measurement data | 2021/6/8 | ||
Generating robust machine learning predictions for semiconductor manufacturing processes | 2021/6/8 | ||
Selective inclusion/exclusion of semiconductor chips in accelerated failure tests | 2020/9/15 | ||
Method for Modelica-based system fault analysis at the design stage | 2020/2/11 |
Co-Authors
