Peter Nellist

Peter Nellist

University of Oxford

H-index: 58

Europe-United Kingdom

About Peter Nellist

Peter Nellist, With an exceptional h-index of 58 and a recent h-index of 39 (since 2020), a distinguished researcher at University of Oxford, specializes in the field of Electron microscopy.

His recent articles reflect a diverse array of research interests and contributions to the field:

Distinguishing Bulk Redox from Near-Surface Degradation in Lithium Nickel Oxide Cathodes

Atomic-scale imaging of polyvinyl alcohol crystallinity using electron ptychography

In‐Situ‐Grown Cu Dendrites Plasmonically Enhance Electrocatalytic Hydrogen Evolution on Facet‐Engineered Cu2O

Atomistic understanding of the coherent interface between lead iodide perovskite and lead iodide

Confessions of a Ptychopath: Detection, Dimensions, Damage and Despair

Combine 4D STEM and EELS Using a Fast Pixelated Direct Detector with Center Hole

How fast is your detector? the effect of temporal response on image quality

Cryogenic electron ptychographic single particle analysis with wide bandwidth information transfer

Peter Nellist Information

University

Position

Professor of Materials

Citations(all)

19839

Citations(since 2020)

7878

Cited By

15299

hIndex(all)

58

hIndex(since 2020)

39

i10Index(all)

138

i10Index(since 2020)

89

Email

University Profile Page

Google Scholar

Peter Nellist Skills & Research Interests

Electron microscopy

Top articles of Peter Nellist

Distinguishing Bulk Redox from Near-Surface Degradation in Lithium Nickel Oxide Cathodes

2024/3/20

Atomic-scale imaging of polyvinyl alcohol crystallinity using electron ptychography

Polymer

2023/10/6

In‐Situ‐Grown Cu Dendrites Plasmonically Enhance Electrocatalytic Hydrogen Evolution on Facet‐Engineered Cu2O

Advanced Materials

2023/10

Atomistic understanding of the coherent interface between lead iodide perovskite and lead iodide

Advanced materials interfaces

2023/10

Confessions of a Ptychopath: Detection, Dimensions, Damage and Despair

2023/8/1

Combine 4D STEM and EELS Using a Fast Pixelated Direct Detector with Center Hole

2023/8/1

How fast is your detector? the effect of temporal response on image quality

Microscopy and Microanalysis

2022/12/8

Cryogenic electron ptychographic single particle analysis with wide bandwidth information transfer

Nature Communications

2023/5/25

Templated 2D polymer heterojunctions for improved photocatalytic hydrogen production

Advanced Materials

2023/5/10

Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions

Ultramicroscopy

2023/4/1

The effect of dynamical scattering on single-plane phase retrieval in electron ptychography

Microscopy and Microanalysis

2023/2/1

Generalised oscillator strength for core-shell electron excitation by fast electrons based on Dirac solutions

2023

Imaging Structural Defects and Associated Oxygen Positions in Li-rich Li1. 2Ni0. 13Mn0. 54Co0. 13O2

Microscopy and Microanalysis

2022/8

Increasing spatial fidelity and SNR of 4D-STEM using multi-frame data fusion

Microscopy and Microanalysis

2022/8/1

Direct imaging of oxygen shifts associated with the oxygen redox of Li-rich layered oxides

Joule

2022/5/6

Aberration-corrected scanning transmission electron microscopy: the potential for nano-and interface science

International Journal of Materials Research

2022/2/3

Aberration correction in the STEM

2022/1/26

Atomic resolution Z-contrast imaging of ultradispersed catalysts

2022/1/26

Direct structure determination by atomic-resolution incoherent STEM imaging

2022/1/26

Synthesis of mono-and few-layered n-type WSe 2 from solid state inorganic precursors

Nanoscale

2022

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