Michael Havrilla
Air Force Institute of Technology
H-index: 19
North America-United States
Top articles of Michael Havrilla
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Development of an Ultrawideband Wire-Grid Polarizer Measurement Standard for Focus Beam System Cross-Polarization Calibration | Jeffrey P Massman Michael J Havrilla | 2024/3/17 | |
Vector Potentials for Uniaxial Media with Sources | Michael Havrilla | 2024/3/17 | |
Bianisotropic Material Characterization Using a Rectangular-to-Square Waveguide | Moriel Gindi Michael J Havrilla | 2024/1/9 | |
Analysis of plane wave propagation in biaxial media for arbitrary incidence angles | Jeffrey P Massman Michael J Havrilla | 2023/3/26 | |
Scalar potentials and applications | Michael Havrilla | 2023/2/1 | |
Modified Thru-Reflect-Match Polarimetric Calibration Technique for Focused Beam Systems | Jeffrey P Massman Michael J Havrilla | 2023/10/8 | |
Generally Incident Fresnel Coefficients for Simple to Biaxial Media Interfaces | J Massman M Havrilla | 2023/9/11 | |
Non-aligned biaxial media theoretical scattering parameter extraction | Jeffrey P Massman Michael J Havrilla | 2022/7/10 | |
Efficient optimization of nonlinear optical devices with ITO/SiO2 layered hyperbolic metamaterials | James A Ethridge John G Jones Manuel D Ferdinandus Michael J Havrilla Michael A Marciniak | 2022/3/4 | |
Optimizing switching of non-linear properties with hyperbolic metamaterials | Optical Materials Express | James A Ethridge John G Jones Manuel R Ferdinandus Michael J Havrilla Michael A Marciniak | 2022/11/1 |
Calibration and Cross-Polarization Measurement Standard Requirements for Focus Beam Material Characterization Systems | Jeffrey P Massman Michael J Havrilla | 2022/10/9 | |
Analysis of general plane wave propagation in biaxial media using the kdb system | J Massman M Havrilla | 2022/9/12 | |
Linear and nonlinear properties of ITO/SiO2 layered metamaterials | James A Ethridge John G Jones Manuel R Ferdinandus Michael J Havrilla Michael A Marciniak | 2021/8/3 | |
Permittivity Estimates of Dielectric Spheres Using Radar Scattering Measurements | IEEE Sensors Letters | Hirsch M Chizever Peter J Collins Michael J Havrilla | 2021/7/21 |
Biaxial material characterization utilizing a focus beam system | Nicholas A O’Gorman Michael J Havrilla | 2020/9/23 |
