Marek Skowronski

Marek Skowronski

Carnegie Mellon University

H-index: 57

North America-United States

About Marek Skowronski

Marek Skowronski, With an exceptional h-index of 57 and a recent h-index of 25 (since 2020), a distinguished researcher at Carnegie Mellon University, specializes in the field of electronic materials, condensed matter physics, solid state electronics.

His recent articles reflect a diverse array of research interests and contributions to the field:

Electrical conductivity of TaOx as function of composition and temperature

Temperature Distribution in TaOx Resistive Switching Devices Assessed In Operando by Scanning Thermal Microscopy

Material instabilities in the TaOx-based resistive switching devices

Growth dominated crystallization of GeTe mushroom cells during partial SET operation

Observation and modelling of homogenous nucleation in Ge 2 Sb 2 Te 5 mushroom cells during SET operation

Precise Final Thinning by Concentrated Ar Ion Beam Milling of Plan View TEM Specimens from Phase Change Memory Device Prepared in Xe Plasma FIB

Density of amorphous sputtered Ge2Sb2Te5 thin films

Segregation-induced Ge precipitation in Ge2Sb2Te5 and N-doped Ge2Sb2Te5 line cells

Marek Skowronski Information

University

Position

___

Citations(all)

11011

Citations(since 2020)

2278

Cited By

9649

hIndex(all)

57

hIndex(since 2020)

25

i10Index(all)

166

i10Index(since 2020)

72

Email

University Profile Page

Carnegie Mellon University

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Marek Skowronski Skills & Research Interests

electronic materials

condensed matter physics

solid state electronics

Top articles of Marek Skowronski

Title

Journal

Author(s)

Publication Date

Electrical conductivity of TaOx as function of composition and temperature

Journal of Non-Crystalline Solids

Kefei Bao

Jingjia Meng

Jonathan D Poplawsky

Marek Skowronski

2023/10/1

Temperature Distribution in TaOx Resistive Switching Devices Assessed In Operando by Scanning Thermal Microscopy

ACS Applied Electronic Materials

Jingjia Meng

Jonathan M Goodwill

Evgheni Strelcov

Kefei Bao

Jabez J McClelland

...

2023/4/10

Material instabilities in the TaOx-based resistive switching devices

Marek Skowronski

2023/3/26

Growth dominated crystallization of GeTe mushroom cells during partial SET operation

Journal of Applied Physics

Yiqi Yu

Marek Skowronski

2023/1/28

Observation and modelling of homogenous nucleation in Ge 2 Sb 2 Te 5 mushroom cells during SET operation

Journal of Materials Chemistry C

Yiqi Yu

Marek Skowronski

2023

Precise Final Thinning by Concentrated Ar Ion Beam Milling of Plan View TEM Specimens from Phase Change Memory Device Prepared in Xe Plasma FIB

CS Bonifacio

ML Ray

PE Fischione

Y Yu

M Skowronski

2023/11/12

Density of amorphous sputtered Ge2Sb2Te5 thin films

AIP Advances

Q Zhang

C Lian

Q Xu

Y Yu

M Skowronski

2023/1/1

Segregation-induced Ge precipitation in Ge2Sb2Te5 and N-doped Ge2Sb2Te5 line cells

AIP Advances

Qiyun Xu

Enkui Lian

Phoebe Yeoh

Marek Skowronski

2022/6/1

Modeling of the Thermodiffusion-Induced Filament Formation in Resistive-Switching Devices

Physical Review Applied

Jingjia Meng

Enkui Lian

Jonathan D Poplawsky

Marek Skowronski

2022/5/24

Simulation of lateral ion migration during electroforming process

arXiv preprint arXiv:2111.06215

Jingjia Meng

Enkui Lian

Jonathan D Poplawsky

Marek Skowronski

2021/11/11

Exchange of Ions across the TiN/TaOx Interface during Electroformation of TaOx-Based Resistive Switching Devices

ACS applied materials & interfaces

Yuanzhi Ma

David A Cullen

Jonathan M Goodwill

Qiyun Xu

Karren L More

...

2020/5/22

Nanoscale density variations in sputtered amorphous TaOx functional layers in resistive switching devices

Journal of Applied Physics

Qiyun Xu

Yuanzhi Ma

Marek Skowronski

2020/2/7

Electrical and Thermal Dynamics of Self-Oscillations in TaOx-Based Threshold Switching Devices

ACS Applied Electronic Materials

Yiqi Yu

Bingyuan Zhao

Jonathan M Goodwill

Yuanzhi Ma

James A Bain

...

2020/2/3

Evolution of the conductive filament with cycling in TaOx-based resistive switching devices

Journal of Applied Physics

Yuanzhi Ma

Phoebe P Yeoh

Liting Shen

Jonathan M Goodwill

James A Bain

...

2020/11/21

Temperature overshoot as the cause of physical changes in resistive switching devices during electro-formation

Journal of Applied Physics

Jingjia Meng

Bingyuan Zhao

Qiyun Xu

Jonathan M Goodwill

James A Bain

...

2020/6/21

See List of Professors in Marek Skowronski University(Carnegie Mellon University)