Leonardo De Chiffre

About Leonardo De Chiffre

Leonardo De Chiffre, With an exceptional h-index of 46 and a recent h-index of 23 (since 2020), a distinguished researcher at Danmarks Tekniske Universitet, specializes in the field of metal cutting, geometrical metrology, process tribology.

His recent articles reflect a diverse array of research interests and contributions to the field:

A novel energy resolved X-ray computed tomography instrument for aviation security: Preliminary metrological investigation

Opportunities and challenges of implementing energy dispersive x-ray CT in aviation security screening

Comparison campaign of XCT systems using machined standards representative of additively manufactured parts

Reconstruction of small components using photogrammetry: a quantitative analysis of the depth of field influence using a miniature step gauge

Dynamic length metrology (DLM) for accurate dimensional measurements in a production environment by continuous determination and compensation of thermal expansion effects in …

Traceability of optical 3D scanner measurements on sand mould in the production of quality castings

Dimensional artefacts to achieve metrological traceability in advanced manufacturing

Reference standards for XCT measurements of additively manufactured parts

Leonardo De Chiffre Information

University

Position

___

Citations(all)

8637

Citations(since 2020)

2870

Cited By

6972

hIndex(all)

46

hIndex(since 2020)

23

i10Index(all)

111

i10Index(since 2020)

63

Email

University Profile Page

Google Scholar

Leonardo De Chiffre Skills & Research Interests

metal cutting

geometrical metrology

process tribology

Top articles of Leonardo De Chiffre

Title

Journal

Author(s)

Publication Date

A novel energy resolved X-ray computed tomography instrument for aviation security: Preliminary metrological investigation

Steffen Sloth

Danilo Quagliotti

Leonardo De Chiffre

Morten Christensen

Henning F Poulsen

2023

Opportunities and challenges of implementing energy dispersive x-ray CT in aviation security screening

Steffen Sloth

Ulrik Lund Olsen

Danilo Quagliotti

Leonardo De Chiffre

Morten Christensen

...

2023

Comparison campaign of XCT systems using machined standards representative of additively manufactured parts

Anne-Françoise Obaton

C Yardin

K Liltorp

D Quagliotti

Leonardo De Chiffre

2022/2

Reconstruction of small components using photogrammetry: a quantitative analysis of the depth of field influence using a miniature step gauge

Metrology and Measurement Systems

Maria Grazia Guerra

Luigi Maria Galantucci

Fulvio Lavecchia

Leonardo De Chiffre

2021

Dynamic length metrology (DLM) for accurate dimensional measurements in a production environment by continuous determination and compensation of thermal expansion effects in …

Measurement Science and Technology

Leonardo De Chiffre

Daniel González-Madruga

Mads Rostgaard Sonne

Giuseppe Dalla Costa

Jesper Henri Hattel

...

2021/6/1

Traceability of optical 3D scanner measurements on sand mould in the production of quality castings

Measurement Science and Technology

Seyed Alireza Yazdanbakhsh

Kamran Mohaghegh

Niels Skat Tiedje

Leonardo De Chiffre

2021/5/13

Dimensional artefacts to achieve metrological traceability in advanced manufacturing

CIRP annals

S Carmignato

L De Chiffre

H Bosse

RK Leach

A Balsamo

...

2020/1/1

Reference standards for XCT measurements of additively manufactured parts

Anne-Françoise Obaton

Christopher Gottlieb Klingaa

Clément Rivet

Kamran Mohaghegh

Sina Baier

...

2020

Investigation on the effect of filtering and plane fitting strategies on differences between XCT and CMM measurements on a miniature step gauge

Kamran Mohaghegh

Vice Roncevic

Jan Lasson Andreasen

Leonardo De Chiffre

2020/2

Use of miniature step gauges to assess the performance of 3D optical scanners and to evaluate the accuracy of a novel additive manufacture process

Sensors

Maria Grazia Guerra

Leonardo De Chiffre

Fulvio Lavecchia

Luigi Maria Galantucci

2020/1/29

Effect of polymer relaxation in automated micro polishing

AIP Conference Proceedings

Soufian Ben Achour

Wule Zhu

Giuliano Bissacco

Anthony Beaucamp

Leonardo De Chiffre

2020/1/10

Deterministic polishing of micro geometries

CIRP annals

Soufian Ben Achour

Giuliano Bissacco

Anthony Beaucamp

Leonardo De Chiffre

2020/1/1

See List of Professors in Leonardo De Chiffre University(Danmarks Tekniske Universitet)

Co-Authors

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