John Vogel

John Vogel

Brigham Young University

H-index: 4

North America-United States

About John Vogel

John Vogel, With an exceptional h-index of 4 and a recent h-index of 4 (since 2020), a distinguished researcher at Brigham Young University, specializes in the field of Batteries, Microfabrication.

His recent articles reflect a diverse array of research interests and contributions to the field:

Li-ion battery electrode contact resistance estimation by mechanical peel test

Flexible electric probe

On the Development and Use of a Micro-Surface Probe for Measurement of Li-Ion Battery Electrical Properties

Measuring and Reducing Contact Resistance at the Current Collector

Micro-flexible-surface probe for determining spatially heterogeneous electronic conductivity of lithium-ion battery electrode films

The impact of calendering on the electronic conductivity heterogenity of lithium-ion electrode films

John Vogel Information

University

Position

___

Citations(all)

111

Citations(since 2020)

90

Cited By

54

hIndex(all)

4

hIndex(since 2020)

4

i10Index(all)

3

i10Index(since 2020)

3

Email

University Profile Page

Google Scholar

John Vogel Skills & Research Interests

Batteries

Microfabrication

Top articles of John Vogel

Li-ion battery electrode contact resistance estimation by mechanical peel test

Journal of the Electrochemical Society

2022/8/10

Flexible electric probe

2022/5/24

John Vogel
John Vogel

H-Index: 3

On the Development and Use of a Micro-Surface Probe for Measurement of Li-Ion Battery Electrical Properties

2022

Measuring and Reducing Contact Resistance at the Current Collector

Electrochemical Society Meeting Abstracts 240

2021/10/19

Micro-flexible-surface probe for determining spatially heterogeneous electronic conductivity of lithium-ion battery electrode films

Journal of The Electrochemical Society

2021/10/8

The impact of calendering on the electronic conductivity heterogenity of lithium-ion electrode films

2020

See List of Professors in John Vogel University(Brigham Young University)

Co-Authors

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