Jay Hind Kumar Verma
Indian Institute of Technology Kanpur
H-index: 4
Asia-India
Top articles of Jay Hind Kumar Verma
Title | Journal | Author(s) | Publication Date |
---|---|---|---|
Investigation of standard and enclosed gate n-MOSFET degradation due to total ionizing dose using BSIM-BULK | Jay Hind Kumar Verma Yogesh Singh Chauhan | 2020/4/6 | |
Modeling of RF Bulk and SOI Planar MOSFETs using Industry Standard BSIM Models | Aarti Rathi Manoj Kumar Jayhind K Verma HS Jatana Yogesh S Chauhan | 2020/11/26 | |
Temperature dependent performance evaluation and linearity analysis of double gate-all-around (DGAA) MOSFET: an advance multigate structure | Silicon | Yogesh Pratap Jay Hind Kumar Verma | 2020/11 |