Jatindra Kumar Deka
Indian Institute of Technology Guwahati
H-index: 13
Asia-India
Top articles of Jatindra Kumar Deka
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Incomplete Testing of SOC | Journal of Electronic Testing | Kunwer Mrityunjay Singh Jatindra Deka Santosh Biswas | 2023/6 |
Conversion of Virtual Lab Experiments using FOSS: A Case Study of Virtual Labs by NMEICT | Nanu Alan Kachari Santosh Biswas Jatindra Kumar Deka | 2021/12/5 | |
Retesting defective circuits to allow acceptable faults for yield enhancement | Journal of Electronic Testing | Sisir Kumar Jena Santosh Biswas Jatindra Kumar Deka | 2021/12 |
Selective fault-masking for improving yield and performance of on-chip networks | Biswajit Bhowmik Jatindra Kumar Deka Santosh Biswas | 2021/10/17 | |
ATPG for Incomplete Testing of SOC Considering Bridging Faults | Kunwer Mrityunjay Singh Santosh Biswas Jatindra Kumar Deka | 2021/12/7 | |
Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels | Biswajit Bhowmik Santosh Biswas Jatindra Kumar Deka | 2020/10/11 | |
Improving reliability in spidergon network on chip-microprocessors | Biswajit Bhowmik Jatindra Kumar Deka Santosh Biswas | 2020/8/9 | |
Approximate testing of digital VLSI circuits using error significance based fault analysis | Sisir Kumar Jena Santosh Biswas Jatindra Kumar Deka | 2020/7/23 | |
Locating open-channels in octagon networks on chip-microprocessors | Biswajit Bhowmik Santosh Biswas Jatindra Kumar Deka Bhargab B Bhattacharya | 2020/7/6 | |
Reliability monitoring in a smart noc component | Biswajit Bhowmik Jatindra Kumar Deka Santosh Biswas | 2020/11/23 | |
Maximizing yield through retesting of rejected circuits using approximation technique | Sisir Kumar Jena Santosh Biswas Jatindra Kumar Deka | 2020/11/16 |
