Jacob Hoogenboom

Jacob Hoogenboom

Technische Universiteit Delft

H-index: 32

Europe-Netherlands

About Jacob Hoogenboom

Jacob Hoogenboom, With an exceptional h-index of 32 and a recent h-index of 17 (since 2020), a distinguished researcher at Technische Universiteit Delft,

His recent articles reflect a diverse array of research interests and contributions to the field:

Depth-dependent scaling of axial distances in light microscopy

Optical STEM detection for scanning electron microscopy

Integrated optical and charged particle inspection apparatus

Need for Speed: Imaging Biological Ultrastructure with the 64-beams FAST-EM

Robust Local Thickness Estimation of Sub‐Micrometer Specimen by 4D‐STEM

Introductie Elektriciteit en Magnetisme

Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution

Reproducible lamella preparation for electron cryo-tomography by in-situ thickness estimation during fluorescence-guided FIB milling

Jacob Hoogenboom Information

University

Position

associate professor Department of Imaging Physics

Citations(all)

3941

Citations(since 2020)

1464

Cited By

3053

hIndex(all)

32

hIndex(since 2020)

17

i10Index(all)

53

i10Index(since 2020)

31

Email

University Profile Page

Technische Universiteit Delft

Google Scholar

View Google Scholar Profile

Top articles of Jacob Hoogenboom

Title

Journal

Author(s)

Publication Date

Depth-dependent scaling of axial distances in light microscopy

bioRxiv

Sergey Loginov

Daan Boltje

Myron NF Hensgens

Jacob P Hoogenboom

Ernest van der Wee

2024

Optical STEM detection for scanning electron microscopy

Ultramicroscopy

Arent J Kievits

BH Peter Duinkerken

Job Fermie

Ryan Lane

Ben NG Giepmans

...

2024/2/1

Integrated optical and charged particle inspection apparatus

2023/8/29

Need for Speed: Imaging Biological Ultrastructure with the 64-beams FAST-EM

Arent J Kievits

BH Peter Duinkerken

Ben NG Giepmans

Jacob P Hoogenboom

2023/8/1

Robust Local Thickness Estimation of Sub‐Micrometer Specimen by 4D‐STEM

Small Methods

Radim Skoupý

Daan B Boltje

Miroslav Slouf

Kateřina Mrázová

Tomáš Láznička

...

2023/5/30

Introductie Elektriciteit en Magnetisme

WG Bouwman

JP Hoogenboom

RPH Haaksman

2023

Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution

Applied Physics Reviews

Mathijs WH Garming

I Gerward C Weppelman

Martin Lee

Thijs Stavenga

Jacob P Hoogenboom

2022/6/1

Reproducible lamella preparation for electron cryo-tomography by in-situ thickness estimation during fluorescence-guided FIB milling

Microscopy and Microanalysis

Radim Skoupy

Daan B Boltje

Jacob P Hoogenboom

Arjen J Jakobi

2022/8

Electron-beam patterned calibration structures for structured illumination microscopy

Scientific Reports

Sangeetha Hari

Johan A Slotman

Yoram Vos

Christian Floris

Wiggert A van Cappellen

...

2022/11/23

Integrated array tomography for 3D correlative light and electron microscopy

Frontiers in Molecular Biosciences

Ryan Lane

Anouk HG Wolters

Ben NG Giepmans

Jacob P Hoogenboom

2022/1/19

3D Fluorescence Localization in Frozen Cells for Targeted Lamella Milling for Electron Cryo-Tomography

Microscopy and Microanalysis

Ernest B van der Wee

Daan B Boltje

Arjen J Jakobi

Jacob P Hoogenboom

2022/8

Correlative light and electron microscopy reveals fork-shaped structures at actin entry sites of focal adhesions

Biology open

Karin Legerstee

Jason Sueters

Tsion E Abraham

Johan A Slotman

Gert-Jan Kremers

...

2022/11/1

Organelle Segmentation Facilitated by Correlative Light Microscopy Data

Microscopy and Microanalysis

Ryan Lane

Luuk Balkenende

Simon Van Staalduine

Anouk HG Wolters

Ben NG Giepmans

...

2022/8

Method for positioning a focal plane of a light imaging device and apparatus arranged for applying said method

P Kruit

JP Hoogenboom

N Liv Hamarat

AC Narvaez Gonzalez

2022

A cryogenic, coincident fluorescence, electron, and ion beam microscope

Elife

Daan B Boltje

Jacob P Hoogenboom

Arjen J Jakobi

Grant J Jensen

Caspar TH Jonker

...

2022/10/28

Characterization and Optimization of OSTEM; A Novel Detection Method for Single-and Multi-Beam Scanning Electron Microscopy

Microscopy and Microanalysis

Arent Kievits

Job Fermie

Peter Duinkerken

Ryan Lane

Elizabeth Carroll

...

2022/8

How innovations in methodology offer new prospects for volume electron microscopy

Arent J Kievits

Ryan Lane

Elizabeth C Carroll

Jacob P Hoogenboom

2022/9

A Cryogenic Fluorescence Microscope Retrofittable in Coincidence with a FIB/SEM

Microscopy and Microanalysis

Daan B Boltje

Jacob P Hoogenboom

Arjen J Jakobi

Grant J Jensen

Caspar TH Jonker

...

2022/8

Imaging resonant micro-cantilever movement with ultrafast scanning electron microscopy

Review of Scientific Instruments

Mathijs WH Garming

Pieter Kruit

Jacob P Hoogenboom

2022/9/1

Retarding field integrated fluorescence and electron microscope

Microscopy and Microanalysis

Yoram Vos

Ryan I Lane

Chris J Peddie

Anouk HG Wolters

Jacob P Hoogenboom

2021/2

See List of Professors in Jacob Hoogenboom University(Technische Universiteit Delft)