Hans G. Kerkhoff
Universiteit Twente
H-index: 22
Europe-Netherlands
Top articles of Hans G. Kerkhoff
Embedded test instrument for intermittent resistive fault detection at chip level and its reuse at board level
2021/4/7
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs
2020/11/23
On-chip embedded instruments data fusion and life-time prognostics of dependable VLSI-SoCs using machine-learning
2020/10/12
Life-time prognostics of dependable VLSI-SoCs using machine-learning
2020/7/13
A new monitor insertion algorithm for intermittent fault detection
2020/5/25
