Francisco Fernandez
Universidad de Sevilla
H-index: 37
Europe-Spain
Top articles of Francisco Fernandez
Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging
AEU-International Journal of Electronics and Communications
2024/3/1
Design considerations for a CMOS 65-nm RTN-based PUF
2023/7/3
Reliability evaluation of IC Ring Oscillator PUFs
2023/7/3
A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array
2023/7/3
A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF
2023/7/3
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices
2023/7/3
A Test Module for Aging Characterization of Digital Circuits
2023/7/3
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
2023/3/26
PACOSYT: A passive component synthesis tool based on machine learning and tailored modeling strategies towards optimal RF and mm-wave circuit designs
IEEE Journal of Microwaves
2023/1/31
Determination of the time constant distribution of a defect-centric time-dependent variability model for sub-100-nm FETs
IEEE Transactions on Electron Devices
2022/8/25
Addressing a New Class of Multi-Objective Passive Device Optimization for Radiofrequency Circuit Design
Electronics
2022/8/22
A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs
Integration
2022/7/1
Impact of BTI and HCI on the reliability of a Majority Voter
2022/6/12
Characterization and analysis of BTI and HCI effects in CMOS current mirrors
2022/6/12
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation
2022/6/12
Machine Learning Approaches for Transformer Modeling
2022/6/12
High-level design of a novel PUF based on RTN
2022/6/12
On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUF
2022/6/12
A novel physical unclonable function using RTN
2022/5/27
On the impact of the biasing history on the characterization of random telegraph noise
IEEE Transactions on Instrumentation and Measurement
2022/5/27
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