Farid N. Najm

Farid N. Najm

University of Toronto

H-index: 45

North America-Canada

About Farid N. Najm

Farid N. Najm, With an exceptional h-index of 45 and a recent h-index of 14 (since 2020), a distinguished researcher at University of Toronto, specializes in the field of Integrated Circuits, VLSI, Computer-Aided Design, Electronic Design Automation.

His recent articles reflect a diverse array of research interests and contributions to the field:

Model order reduction for lumped RC transmission lines

Fast electromigration simulation for chip power grids

Electromigration assessment in power grids with account of redundancy and non-uniform temperature distribution

Equivalent circuits for electromigration

Novel physics-based tool-prototype for electromigration assessment in commercial-grade power delivery networks

Experimental validation of a novel methodology for electromigration assessment in on-chip power grids

Electromigration checking using a stochastic effective current model

Electromigration simulation and design considerations for integrated circuit power grids

Farid N. Najm Information

University

Position

Professor of Electrical & Computer Engineering

Citations(all)

9993

Citations(since 2020)

799

Cited By

9335

hIndex(all)

45

hIndex(since 2020)

14

i10Index(all)

122

i10Index(since 2020)

20

Email

University Profile Page

University of Toronto

Google Scholar

View Google Scholar Profile

Farid N. Najm Skills & Research Interests

Integrated Circuits

VLSI

Computer-Aided Design

Electronic Design Automation

Top articles of Farid N. Najm

Title

Journal

Author(s)

Publication Date

Model order reduction for lumped RC transmission lines

Authorea Preprints

Farid N Najm

2023/9/11

Fast electromigration simulation for chip power grids

Bijan Shahriari

Farid N Najm

2023/4/5

Electromigration assessment in power grids with account of redundancy and non-uniform temperature distribution

Armen Kteyan

Valeriy Sukharev

Alexander Volkov

Jun Ho Choy

Farid N Najm

...

2023/3/26

Equivalent circuits for electromigration

Microelectronics Reliability

Farid N Najm

2021/8/1

Novel physics-based tool-prototype for electromigration assessment in commercial-grade power delivery networks

Journal of Vacuum Science & Technology B

Sofya Torosyan

Armen Kteyan

Valeriy Sukharev

Jun-Ho Choy

Farid N Najm

2021/1/1

Experimental validation of a novel methodology for electromigration assessment in on-chip power grids

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Valeriy Sukharev

Armen Kteyan

Farid N Najm

Yong Hyeon Yi

Chris H Kim

...

2021/12/13

Electromigration checking using a stochastic effective current model

Adam Issa

Valeriy Sukharev

Farid N Najm

2020/11/2

Electromigration simulation and design considerations for integrated circuit power grids

Journal of Vacuum Science & Technology B

Farid N Najm

Valeriy Sukharev

2020/11/1

Personal Background

Rajas Chordiya

Stoyan Dimitrov

2023/5/1

See List of Professors in Farid N. Najm University(University of Toronto)