Enxia Zhang

Enxia Zhang

Vanderbilt University

H-index: 39

North America-United States

About Enxia Zhang

Enxia Zhang, With an exceptional h-index of 39 and a recent h-index of 29 (since 2020), a distinguished researcher at Vanderbilt University, specializes in the field of Radiation effects and reliability of microelectronic devices and circuits.

His recent articles reflect a diverse array of research interests and contributions to the field:

Defects in as-processed, irradiated, and stressed GaAs-based device structures

LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices

Low-frequency noise due to iron impurity centers in GaN-based HEMTs

Negative bias-temperature instabilities and low-frequency noise in Ge FinFETs

Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator’s Radiation Failure Probabilities

On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs

Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

Proton radiation effects on optically transduced silicon carbide microdisk resonators

Enxia Zhang Information

University

Position

___

Citations(all)

5329

Citations(since 2020)

3149

Cited By

3321

hIndex(all)

39

hIndex(since 2020)

29

i10Index(all)

162

i10Index(since 2020)

113

Email

University Profile Page

Vanderbilt University

Google Scholar

View Google Scholar Profile

Enxia Zhang Skills & Research Interests

Radiation effects and reliability of microelectronic devices and circuits

Top articles of Enxia Zhang

Title

Journal

Author(s)

Publication Date

Defects in as-processed, irradiated, and stressed GaAs-based device structures

Bulletin of the American Physical Society

Andrew O'Hara

Xuyi Luo

Enxia Zhang

Ronald Schrimpf

Daniel Fleetwood

...

2024/3/5

LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices

IEEE Transactions on Nuclear Science

Arijit Sengupta

Dennis R Ball

Andrew L Sternberg

Sajal Islam

Aditha S Senarath

...

2024/1/23

Low-frequency noise due to iron impurity centers in GaN-based HEMTs

IEEE Transactions on Electron Devices

Daniel M Fleetwood

Xun Li

En Xia Zhang

Ronald D Schrimpf

Sokrates T Pantelides

2024/1/3

Negative bias-temperature instabilities and low-frequency noise in Ge FinFETs

IEEE Transactions on Device and Materials Reliability

Xuyi Luo

En Xia Zhang

Peng Fei Wang

Kan Li

Dimitri Linten

...

2023/1/30

Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator’s Radiation Failure Probabilities

IEEE Transactions on Nuclear Science

Richard H Nederlander

Arthur F Witulski

Robert A Reed

Gabor Karsai

Ray L Ladbury

...

2023/6/9

On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs

IEEE Transactions on Nuclear Science

Joseph V D’Amico IV

Sean T Vibbert

Rick M Cadena

Michael L Alles

Dennis R Ball

...

2023/12/14

Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

IEEE Transactions on Nuclear Science

Kan Li

Xuyi Luo

MW Rony

Mariia Gorchichko

Gaspard Hiblot

...

2023/1/25

Proton radiation effects on optically transduced silicon carbide microdisk resonators

Optical Materials Express

Hao Jia

Jonathan P McCandless

Hailong Chen

Wenjun Liao

En Xia Zhang

...

2023/6/1

Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Towards Radiation-Tolerant Embedded Nonvolatile Memory

IEEE Electron Device Letters

Zhouhang Jiang

Zixiang Guo

Xuyi Luo

Munazza Sayed

Zubair Faris

...

2023/11/13

Total-Ionizing-Dose Effects at Ultrahigh Doses in AlGaN/GaN HEMTs

IEEE Transactions on Nuclear Science

Stefano Bonaldo

En Xia Zhang

Serena Mattiazzo

Alessandro Paccagnella

Simone Gerardin

...

2023/1/18

Low-frequency and random telegraph noise in 14-nm bulk si charge-trap transistors

IEEE Transactions on Electron Devices

Mariia Gorchichko

En Xia Zhang

Mahmud Reaz

Kan Li

Peng Fei Wang

...

2023/4/25

Fabricating And Testing AlGaInAs Multiple Quantum-Well Laser Diodes For Space Application

Di Huang

Bryant Colin

Kellen P Arnold

Enxia Zhang

Sharon M Weiss

...

2023/11/12

Total-ionizing-dose effects on 3D sequentially-integrated FDSOI ring oscillators

IEEE Transactions on Nuclear Science

Shintaro Toguchi

En Xia Zhang

Daniel M Fleetwood

Ronald D Schrimpf

Stephane Moreau

...

2023/1/10

Total-Ionizing-Dose Effects and Low-Frequency Noise in N-type Carbon Nanotube Field-Effect Transistors with HfO2 Gate Dielectrics

IEEE Transactions on Nuclear Science

Patrick K Darmawi-Iskandar

Andrew M Aaron

En Xia Zhang

Bharat L Bhuva

Jeffery S Kauppila

...

2023/2/6

Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices

IEEE Transactions on Nuclear Science

Daniel M Fleetwood

En Xia Zhang

Ronald D Schrimpf

Sokrates T Pantelides

Stefano Bonaldo

2023/10/10

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors with SiO2 Oxygen-Penetration Layers

IEEE Transactions on Nuclear Science

Zixiang Guo

Kan Li

Xun Li

Xuyi Luo

En Xia Zhang

...

2023/5/26

Impact of heavy-ion range on single-event effects in silicon carbide power junction barrier Schottky diodes

IEEE Transactions on Nuclear Science

Arijit Sengupta

Dennis R Ball

Arthur F Witulski

En Xia Zhang

Ronald D Schrimpf

...

2023/2/3

Single-Event Burnout by Cf-252 Irradiation in Vertical -Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate

Sajal Islam

Aditha S Senarath

Arijit Sengupta

En Xia Zhang

Dennis R Ball

...

2023/6/25

Low-Frequency Noise and Deep Level Transient Spectroscopy in npn Si Bipolar Junction Transistors Irradiated with Si Ions

IEEE Transactions on Nuclear Science

Xuyi Luo

Jossue Montes

Sabina D Koukourinkova

Bastiaan L Vaandrager

Edward S Bielejec

...

2023/12/25

Combined Effect of TID Radiation and Electrical Stress on NMOSFETs

Micromachines

Yanrong Cao

Min Wang

Xuefeng Zheng

Enxia Zhang

Ling Lv

...

2022/10/29

See List of Professors in Enxia Zhang University(Vanderbilt University)