Chia-Yu Hsu
National Taipei University of Technology
H-index: 23
Asia-Taiwan
Top articles of Chia-Yu Hsu
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
An artificial intelligence transformation model–pod redesign of photomasks in semiconductor manufacturing | Journal of Industrial and Production Engineering | Shu-Kai S Fan Ming-Shen Chen Chia-Yu Hsu You-Jin Park | 2023/11/10 |
Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention | Computers & Industrial Engineering | Chia-Yu Hsu Yi-Wei Lu | 2023/12/1 |
Temporal convolution-based long-short term memory network with attention mechanism for remaining useful life prediction | IEEE Transactions on Semiconductor Manufacturing | Chia-Yu Hsu Yi-Wei Lu Jia-Hong Yan | 2022/4/6 |
Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification | Journal of Intelligent Manufacturing | Chia-Yu Hsu Ju-Chien Chien | 2022/3 |
Key feature identification for monitoring wafer-to-wafer variation in semiconductor manufacturing | IEEE Transactions on Automation Science and Engineering | Shu-Kai S Fan Chia-Yu Hsu Du-Ming Tsai Mabel C Chou Chih-Hung Jen | 2022/1/17 |
Data visualization of anomaly detection in semiconductor processing tools | IEEE Transactions on Semiconductor Manufacturing | Shu-Kai S Fan Du-Ming Tsai Chih-Hung Jen Chia-Yu Hsu Fei He | 2021/12/23 |
L-measure evaluation metric for fake information detection models with binary class imbalance | Enterprise Information Systems | Li Li Yong Wang Chia-Yu Hsu Yibin Li Kuo-Yi Lin | 2021/11/26 |
Applications of new industrial engineering methodologies | Qiuhong Zhao Runliang Dou Kuo-Yi Lin Chia-Yu Hsu | 2021/9 | |
Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing | Journal of Intelligent Manufacturing | Chia-Yu Hsu Wei-Chen Liu | 2021/3 |
Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes | Advanced Engineering Informatics | Shu-Kai S Fan Chia-Yu Hsu Chih-Hung Jen Kuan-Lung Chen Li-Ting Juan | 2020/10/1 |
A new double exponentially weighted moving average run-to-run control using a disturbance-accumulating strategy for mixed-product mode | Quality and Reliability Engineering International | Kashinath Chatterjee Christos Koukouvinos Angeliki Lappa | 2022/6 |
An autoencoder gated recurrent unit for remaining useful life prediction | Processes | Yi-Wei Lu Chia-Yu Hsu Kuang-Chieh Huang | 2020/9/15 |
A review on fault detection and process diagnostics in industrial processes | You-Jin Park Shu-Kai S Fan Chia-Yu Hsu | 2020/9/9 | |
A two-phase non-dominated sorting particle swarm optimization for chip feature design to improve wafer exposure effectiveness | Computers & Industrial Engineering | Chia-Yu Hsu Shih-Chang Chiu | 2020/9/1 |
Data-driven approach for fault detection and diagnostic in semiconductor manufacturing | International Journal of Electrical Power & Energy Systems | Ali Ajami Mahdi Daneshvar | 2012/12/1 |
Similarity matching of wafer bin maps for manufacturing intelligence to empower industry 3.5 for semiconductor manufacturing | Computers & Industrial Engineering | Chia-Yu Hsu Wei-Ju Chen Ju-Chien Chien | 2020/4/1 |
Corrigendum to “Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes”[Adv. Eng. Informat. 46 (2020) 101166](Advanced Engineering … | Advanced Engineering Informatics | Shu Kai S Fan Chia Yu Hsu Chih Hung Jen Kuan Lung Chen Li Ting Juan | 2020/10 |
