C. Claeys
Katholieke Universiteit Leuven
H-index: 45
Europe-Belgium
Top articles of C. Claeys
Title | Journal | Author(s) | Publication Date |
---|---|---|---|
3D backside integration of FinFETs: Is there an impact on LF noise? | Solid-State Electronics | Eddy Simoen Anne Jourdain Cor Claeys Anabela Veloso | 2023/9/1 |
(Keynote) Technological Challenges and Emerging Device Architectures for Future Semiconductor Micro and Nanoelectronics | Electrochemical Society Meeting Abstracts 243 | Cor Claeys Eddy Simoen | 2023/8/28 |
The European Flagship Conferences ESSDERC and ESSCIRC Merge to Become ESSERC [Conference Reports] | IEEE Solid-State Circuits Magazine | Joachim N Burghartz Michiel Steyaert Cor Claeys Piero Malcovati | 2023/8/18 |
RTS Noise Characterization of Trap Properties in InGaAs nFinFETs | IEEE Transactions on Electron Devices | Xiaolei Xiao Liang He Hua Chen Xianyu Wang Eddy Simoen | 2023/6/5 |
Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs | Solid-State Electronics | Eddy Simoen Anabela Veloso Philippe Matagne Cor Claeys | 2022/8/1 |
(Electronics and Photonics Division Award) The Impact of Defects on the Performance of Semiconductor Devices and Materials | Electrochemical Society Meeting Abstracts 241 | Eddy Simoen K Takakura Brent Hsu Cor Claeys | 2022/7/7 |
The Low-Frequency Noise Behavior of Advanced Logic and Memory Devices | Eddy Simoen Romain Ritzenthaler Hans Mertens Eugenio Dentoni Litta Naoto Horiguchi | 2022/6/20 | |
Tunnel-FET evolution and applications for analog circuits | Journal of Integrated Circuits and Systems | Paula Ghedini Der Agopian Joao A Martino Eddy Simoen Rita Rooyackers Cor Claeys | 2022 |
Frontiers in low-frequency noise research in advanced semiconductor devices | Eddy Simoen Anabela Veloso Barry O'Sullivan Kenichiro Takakura Cor Claeys | 2021/3/14 | |
Impact of processing factors on the low-frequency noise of gate-all-around silicon vertical nanowire FETs | ECS Transactions | Eddy Simoen Anabela Veloso Philippe Matagne Cor Claeys | 2021/10/1 |
HVEM studies of nitride film edge induced defect generation in silicon substrates | J Vanhellemont Corneel Claeys J Van Landuyt | 2021/1/31 | |
Low frequency noise performance of horizontal, stacked and vertical silicon nanowire MOSFETs | Solid-State Electronics | Eddy Simoen Alberto Vinicius de Oliveira Paula Ghedini Der Agopian Romain Ritzenthaler Hans Mertens | 2021/10/1 |
Interfacial Properties of nMOSFETs With Different Al2O3 Capping Layer Thickness and TiN Gate Stacks | IEEE Transactions on Electron Devices | Danghui Wang Tianhan Xu Eddy Simoen Bogdan Govoreanu Cor Claeys | 2021/1/15 |
Detailed low frequency noise assessment on GAA NW n-channel FETs | Solid-State Electronics | B Cretu A Bordin E Simoen G Hellings D Linten | 2021/8/1 |
Defects in crystalline silicon | Advanced and Selniconducting Silicon~ Alloy Based Material and Devices, JFA-Nijs, Ed.(Inst. of Phys. Pub., Bristol, 1994) pp | Cor Claeys Jan Vanhellemont | 2021/5/30 |
Impact of gate current on the operational transconductance amplifier designed with nanowire TFETs | Solid-State Electronics | Alexandro de M Nogueira Paula GD Agopian Eddy Simoen Rita Rooyackers Cor Claeys | 2021/12/1 |
Defect Engineering for Monolithic Integration of III-V Semiconductors on Silicon Substrates | ECS Transactions | Cor Claeys Eddy Simoen | 2021/5/7 |
Temperature-Dependent Electrical Properties of nMOSFETs With Different Thickness Al₂O₃ Capping Layer and TiN Gate | IEEE Transactions on Electron Devices | Danghui Wang Junna Zheng Yang Zhang Tianhan Xu Eddy Simoen | 2021/10/19 |
Electrical Activity of Extended Defects in Relaxed InxGa1− xAs Hetero-Epitaxial Layers | ECS Journal of Solid State Science and Technology | Cor Claeys P-C Hsu Yves Mols H Han Hugo Bender | 2020/2/19 |
Using the hexagonal layout style for Mosfets to boost the device matching in ionizing radiation environments | Journal of Integrated Circuits and Systems | Vinicius Vono Peruzzi William Cruz Gabriel Augusto da Silva Eddy Simoen Cor Claeys | 2020/8/10 |