Tobias A de Jong

About Tobias A de Jong

Tobias A de Jong, With an exceptional h-index of 7 and a recent h-index of 6 (since 2020), a distinguished researcher at Universiteit Leiden, specializes in the field of Low-Energy Electron Microscopy, Image Analysis, 2D materials, Graphene, Earth Observation.

His recent articles reflect a diverse array of research interests and contributions to the field:

Daily global methane super-emitter detection and source identification with sub-daily tracking

Flat Moiré Bands in Twisted Bilayer

Stacking domain morphology in epitaxial graphene on silicon carbide

Direct observation of Γ moiré bands in twisted bilayer WSe2

Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide

Imaging moiré deformation and dynamics in twisted bilayer graphene

Superlattices in van der Waals materials: a low-energy electron microscopy study

LEEM imaging of the moiré pattern of twisted bilayer graphene

Tobias A de Jong Information

University

Position

PhD student

Citations(all)

300

Citations(since 2020)

292

Cited By

58

hIndex(all)

7

hIndex(since 2020)

6

i10Index(all)

7

i10Index(since 2020)

6

Email

University Profile Page

Google Scholar

Tobias A de Jong Skills & Research Interests

Low-Energy Electron Microscopy

Image Analysis

2D materials

Graphene

Earth Observation

Top articles of Tobias A de Jong

Daily global methane super-emitter detection and source identification with sub-daily tracking

2024/2/1

Tobias A De Jong
Tobias A De Jong

H-Index: 5

Flat Moiré Bands in Twisted Bilayer

Physical Review Letters

2023/7/25

Stacking domain morphology in epitaxial graphene on silicon carbide

Physical Review Materials

2023/3/17

Tobias A De Jong
Tobias A De Jong

H-Index: 5

Johannes Jobst
Johannes Jobst

H-Index: 14

Direct observation of Γ moiré bands in twisted bilayer WSe2

Bulletin of the American Physical Society

2023/3/8

Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide

Physical Review B

2023/2/22

Tobias A De Jong
Tobias A De Jong

H-Index: 5

Johannes Jobst
Johannes Jobst

H-Index: 14

Imaging moiré deformation and dynamics in twisted bilayer graphene

Nature Communications

2022/1/10

Tobias A De Jong
Tobias A De Jong

H-Index: 5

Milan P Allan
Milan P Allan

H-Index: 15

Superlattices in van der Waals materials: a low-energy electron microscopy study

2022/11/3

LEEM imaging of the moiré pattern of twisted bilayer graphene

Bulletin of the American Physical Society

2021/3/19

Measuring local moiré lattice heterogeneity of twisted bilayer graphene

Physical Review Research

2021/2/16

Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis

Ultramicroscopy

2020/6/1

Tobias A De Jong
Tobias A De Jong

H-Index: 5

Johannes Jobst
Johannes Jobst

H-Index: 14

See List of Professors in Tobias A de Jong University(Universiteit Leiden)

Co-Authors

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