Michael Engstler

About Michael Engstler

Michael Engstler, With an exceptional h-index of 12 and a recent h-index of 10 (since 2020), a distinguished researcher at Universität des Saarlandes,

His recent articles reflect a diverse array of research interests and contributions to the field:

Correlative microscopy using SEM based nano-CT

Nucleation burst in additively manufactured Inconel 718: 3D characterization of ISRO-induced equiaxed microstructure

A 3D characterization of equiaxed grains induced by mediated nucleation in additively manufactured Inconel 718

Phase Continuity, Brittle to Ductile Transition Temperature, and Creep Behavior of a Eutectic Mo–20Si–52.8 Ti Alloy

Impact of temperature on chlorine contamination and segregation for Ti (C, N) CVD thin hard coating studied by nano-SIMS and atom probe tomography

Hafnia-doped silicon bond coats manufactured by PVD for SiC/SiC CMCs

Correlative Tomography–Combining X-ray Nanotomography and FIB/SEM Serial Sectioning to analyze Al-Si cast alloys

Michael Engstler Information

University

Position

___

Citations(all)

940

Citations(since 2020)

707

Cited By

519

hIndex(all)

12

hIndex(since 2020)

10

i10Index(all)

15

i10Index(since 2020)

10

Email

University Profile Page

Google Scholar

Top articles of Michael Engstler

Correlative microscopy using SEM based nano-CT

2023/10/5

Nucleation burst in additively manufactured Inconel 718: 3D characterization of ISRO-induced equiaxed microstructure

Additive Manufacturing

2023/3/25

A 3D characterization of equiaxed grains induced by mediated nucleation in additively manufactured Inconel 718

IOP Conference Series: Materials Science and Engineering

2023

Phase Continuity, Brittle to Ductile Transition Temperature, and Creep Behavior of a Eutectic Mo–20Si–52.8 Ti Alloy

Advanced Engineering Materials

2022/11

Impact of temperature on chlorine contamination and segregation for Ti (C, N) CVD thin hard coating studied by nano-SIMS and atom probe tomography

Scripta Materialia

2022/2/1

Hafnia-doped silicon bond coats manufactured by PVD for SiC/SiC CMCs

Acta Materialia

2020/1/15

Michael Engstler
Michael Engstler

H-Index: 10

Uwe Schulz
Uwe Schulz

H-Index: 11

Correlative Tomography–Combining X-ray Nanotomography and FIB/SEM Serial Sectioning to analyze Al-Si cast alloys

2020

Michael Engstler
Michael Engstler

H-Index: 10

Frank Mücklich
Frank Mücklich

H-Index: 38

See List of Professors in Michael Engstler University(Universität des Saarlandes)

Co-Authors

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