Emilio José Márquez Navarro
Universidad de Cádiz
H-index: 28
Europe-Spain
Top articles of Emilio José Márquez Navarro
Title | Journal | Author(s) | Publication Date |
|---|---|---|---|
Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 µm) Ellipsometry and FIB-SEM Microscopy | Emilio Márquez Eduardo Blanco J Manuel Mánuel Manuel Ballester Marcos García-Gurrea | 2023/8/18 | |
Complex dielectric function of H-free a-Si films: Photovoltaic light absorber | Materials Letters | E Marquez M Ballester M Garcia M Cintado AP Marquez | 2023/8/15 |
Deep Learning Method to Find Swanepoel Envelopes in Transmission Spectroscopy | Manuel Ballester Emilio Marquez Almudena P Marquez Santiago Lopez-Tapia Oliver Cossairt | 2023/8/14 | |
Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly … | Coatings | E Márquez E Blanco M García-Gurrea M Cintado Puerta M Domínguez de la Vega | 2023/6/25 |
Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity | Coatings | Emilio Márquez Eduardo Blanco José M Mánuel Manuel Ballester Marcos García-Gurrea | 2023/12/19 |
Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum … | Nanomaterials | Dorian Minkov George Angelov Emilio Marquez Rossen Radonov Rostislav Rusev | 2023/8/24 |
Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si | Journal of Non-Crystalline Solids | M Ballester AP Márquez C García-Vázquez JM Díaz E Blanco | 2022/10/15 |
Application of the holomorphic tauc-lorentz-urbach function to extract the optical constants of amorphous semiconductor thin films | Coatings | Manuel Ballester Marcos García Almudena P Márquez Eduardo Blanco Susana M Fernández | 2022/10/14 |
Comparison of optical characterization methods for transmission spectroscopy | Manuel Ballester Almudena P Márquez Srutarshi Banerjee Juan J Ruíz-Pérez Oliver Cossairt | 2022/7/11 | |
Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region | Materials | Dorian Minkov Lian Nedelchev George Angelov Emilio Marquez Blaga Blagoeva | 2022/12/2 |
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization | Coatings | Emilio Márquez Juan J Ruíz-Pérez Manuel Ballester Almudena P Márquez Eduardo Blanco | 2021/10/29 |
Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum | Materials | Dorian Minkov Emilio Marquez George Angelov Gavril Gavrilov Susana Ruano | 2021/8/19 |
Optical Transmittance for Strongly-Wedge-Shaped Semiconductor Films: Appearance of Envelope-Crossover Points in Amorphous As-Based Chalcogenide Materials | Coatings | Juan José Ruiz-Perez Emilio Márquez-Navarro | 2020/11/5 |
Spectroscopic ellipsometry study of non-hydrogenated fully amorphous silicon films deposited by room-temperature radio-frequency magnetron sputtering on glass: Influence of the … | Journal of Non-Crystalline Solids | E Márquez E Blanco C García-Vázquez JM Díaz E Saugar | 2020/11/1 |
Perfecting the dispersion model free characterization of a thin film on a substrate specimen from its normal incidence interference transmittance spectrum | Thin Solid Films | DA Minkov GV Angelov RN Nestorov E Marquez | 2020/7/31 |
