Tim Houben

About Tim Houben

Tim Houben, With an exceptional h-index of 3 and a recent h-index of 3 (since 2020), a distinguished researcher at Technische Universiteit Eindhoven, specializes in the field of Computer Vision, Image Processing, Machine Learning.

His recent articles reflect a diverse array of research interests and contributions to the field:

IndustReal: A Dataset for Procedure Step Recognition Handling Execution Errors in Egocentric Videos in an Industrial-Like Setting

Proceedings of the Workshop on 3D Geometry Generation for Scientific Computing

Probing EUV resist defect detectability using a SEM simulation framework

A multi-wafer case study for 3D geometry prediction of FinFET-like structures with top-down SEM imaging

Training procedure for scanning electron microscope 3D surface reconstruction using unsupervised domain adaptation with simulated data

Depth estimation from SEM images using deep learning and angular data diversity

Depth estimation from a single SEM image using pixel-wise fine-tuning with multimodal data

Apparatus and method for determining three dimensional data based on an image of a patterned substrate

Tim Houben Information

University

Position

___

Citations(all)

41

Citations(since 2020)

41

Cited By

12

hIndex(all)

3

hIndex(since 2020)

3

i10Index(all)

2

i10Index(since 2020)

2

Email

University Profile Page

Google Scholar

Tim Houben Skills & Research Interests

Computer Vision

Image Processing

Machine Learning

Top articles of Tim Houben

IndustReal: A Dataset for Procedure Step Recognition Handling Execution Errors in Egocentric Videos in an Industrial-Like Setting

2024

Tim Houben
Tim Houben

H-Index: 2

Fons Van Der Sommen
Fons Van Der Sommen

H-Index: 14

Probing EUV resist defect detectability using a SEM simulation framework

2023/11/18

Tim Houben
Tim Houben

H-Index: 2

A multi-wafer case study for 3D geometry prediction of FinFET-like structures with top-down SEM imaging

2023/9/14

Tim Houben
Tim Houben

H-Index: 2

Fons Van Der Sommen
Fons Van Der Sommen

H-Index: 14

Training procedure for scanning electron microscope 3D surface reconstruction using unsupervised domain adaptation with simulated data

Journal of Micro/Nanopatterning, Materials, and Metrology

2023/7/1

Depth estimation from SEM images using deep learning and angular data diversity

2023/4/27

Depth estimation from a single SEM image using pixel-wise fine-tuning with multimodal data

Machine Vision and Applications

2022/7

Apparatus and method for determining three dimensional data based on an image of a patterned substrate

2024/2/15

Depth estimation from a single CD-SEM image using domain adaptation with multimodal data

2022/3/4

Automatic quality assessment of transperineal ultrasound images of the male pelvic region, using deep learning

Ultrasound in medicine & biology

2020/2/1

See List of Professors in Tim Houben University(Technische Universiteit Eindhoven)