Ryan Lane

Technische Universiteit Delft

H-index: 4

Europe-Netherlands

About Ryan Lane

Ryan Lane, With an exceptional h-index of 4 and a recent h-index of 4 (since 2020), a distinguished researcher at Technische Universiteit Delft, specializes in the field of electron microscopy, CLEM.

His recent articles reflect a diverse array of research interests and contributions to the field:

Optical STEM detection for scanning electron microscopy

How innovations in methodology offer new prospects for volume electron microscopy

Integrated array tomography for 3D correlative light and electron microscopy

Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy

Label-free fluorescence predictions from large-scale correlative light and electron microscopy data

Retarding field integrated fluorescence and electron microscope

Ryan Lane Information

University	Technische Universiteit Delft
Position	___
Citations(all)	41
Citations(since 2020)	40
Cited By	6
hIndex(all)	4
hIndex(since 2020)	4
i10Index(all)	2
i10Index(since 2020)	2
Email	Access Email
University Profile Page	Technische Universiteit Delft
Google Scholar	View Google Scholar Profile

Ryan Lane Skills & Research Interests

electron microscopy

CLEM

Ryan Lane

Technische Universiteit Delft

About Ryan Lane

Ryan Lane Information

Ryan Lane Skills & Research Interests

Top articles of Ryan Lane

Optical STEM detection for scanning electron microscopy

Ryan Lane

How innovations in methodology offer new prospects for volume electron microscopy

Ryan Lane

Elizabeth C Carroll

Integrated array tomography for 3D correlative light and electron microscopy

Ryan Lane

Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy

Ryan Lane

Nalan Liv

Label-free fluorescence predictions from large-scale correlative light and electron microscopy data

Ryan Lane

Ben Giepmans

Jacob Hoogenboom

Retarding field integrated fluorescence and electron microscope