Moritz Fieback

About Moritz Fieback

Moritz Fieback, With an exceptional h-index of 11 and a recent h-index of 11 (since 2020), a distinguished researcher at Technische Universiteit Delft, specializes in the field of Testing of Emerging Computing Technologies.

His recent articles reflect a diverse array of research interests and contributions to the field:

2023 JETTA Reviewers

Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs

Device-Aware Test for Ion Depletion Defects in RRAMs

Characterization and Test of Intermittent Over RESET in RRAMs

Device Aware Diagnosis for Unique Defects in STT-MRAMs

Dependability of Future Edge-AI Processors: Pandora’s Box

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs

Moritz Fieback Information

University

Position

___

Citations(all)

298

Citations(since 2020)

297

Cited By

44

hIndex(all)

11

hIndex(since 2020)

11

i10Index(all)

12

i10Index(since 2020)

12

Email

University Profile Page

Google Scholar

Moritz Fieback Skills & Research Interests

Testing of Emerging Computing Technologies

Top articles of Moritz Fieback

Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing

2024/4/9

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs

2023/10/7

Device-Aware Test for Ion Depletion Defects in RRAMs

2023/10/7

Characterization and Test of Intermittent Over RESET in RRAMs

2023/10/14

Device Aware Diagnosis for Unique Defects in STT-MRAMs

2023/10/14

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs

2023/5/22

Online Fault Detection and Diagnosis in RRAM

2023/5/22

Device-Aware Test for Back-Hopping Defects in STT-MRAMs

2023/4/17

Using Hopfield Networks to Correct Instruction Faults

2022/11/21

Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT

2022/9/23

Recent trends and perspectives on defect-oriented testing

2022/9/12

Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

2022/9/5

Moritz Fieback
Moritz Fieback

H-Index: 4

Said Hamdioui
Said Hamdioui

H-Index: 24

Structured Test Development Approach for Computation-in-Memory Architectures

2022/8/24

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory

2022/5/23

Defects, Fault Modeling, and Test Development Framework for RRAMs

ACM Journal on Emerging Technologies in Computing Systems (JETC)

2022/4/28

POS1-Hierarchical Memory Diagnosis

2022

Testing rram and computation-in-memory devices: Defects, fault models, and test solutions

2022

See List of Professors in Moritz Fieback University(Technische Universiteit Delft)

Co-Authors

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