Moritz Fieback
Technische Universiteit Delft
H-index: 11
Europe-Netherlands
Top articles of Moritz Fieback
2023 JETTA Reviewers
2024
Patrick Girard
H-Index: 12
Ujjwal Guin
H-Index: 17
Stefan Holst
H-Index: 8
Ke Huang
H-Index: 12
Xing Huang
H-Index: 1
Yu Huang
H-Index: 2
Shi-Yu Huang
H-Index: 15
Ayush Jain
H-Index: 1
Hailong Jiao
H-Index: 11
Biresh Kumar Joardar
H-Index: 6
Kyle Juretus
H-Index: 6
Chandan Karfa
H-Index: 7
Erik Larsson
H-Index: 12
Jin-Fu Li
H-Index: 11
Nimisha Limaye
H-Index: 3
Hadi Mardani Kamali
H-Index: 11
Lilas Alrahis
H-Index: 3
Md Toufiq Hasan Anik
H-Index: 2
Javad Bahrami
H-Index: 0
Tiago Balen
H-Index: 7
Jason Brown
H-Index: 11
Guilherme Cardoso Medeiros
H-Index: 6
Rajat Chakraborty
H-Index: 3
Urbi Chatterjee
H-Index: 5
Abhijit Chatterjee
H-Index: 16
Xin Chen
H-Index: 14
Wei Cheng
H-Index: 2
Mohammad Ebrahimabadi
H-Index: 1
Moritz Fieback
H-Index: 4
Ali Ghaffari
H-Index: 0
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing
2024/4/9
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs
2023/10/7
Device-Aware Test for Ion Depletion Defects in RRAMs
2023/10/7
Characterization and Test of Intermittent Over RESET in RRAMs
2023/10/14
Device Aware Diagnosis for Unique Defects in STT-MRAMs
2023/10/14
Dependability of Future Edge-AI Processors: Pandora’s Box
2023/5/22
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs
2023/5/22
Online Fault Detection and Diagnosis in RRAM
2023/5/22
Device-Aware Test for Back-Hopping Defects in STT-MRAMs
2023/4/17
Using Hopfield Networks to Correct Instruction Faults
2022/11/21
Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT
2022/9/23
Recent trends and perspectives on defect-oriented testing
2022/9/12
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs
2022/9/5
Moritz Fieback
H-Index: 4
Said Hamdioui
H-Index: 24
Structured Test Development Approach for Computation-in-Memory Architectures
2022/8/24
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
2022/5/23
Hierarchical Memory Diagnosis
2022/5/23
Defects, Fault Modeling, and Test Development Framework for RRAMs
ACM Journal on Emerging Technologies in Computing Systems (JETC)
2022/4/28
POS1-Hierarchical Memory Diagnosis
2022
Testing rram and computation-in-memory devices: Defects, fault models, and test solutions
2022