Chia-Yu Hsu
National Taipei University of Technology
H-index: 23
Asia-Taiwan
Top articles of Chia-Yu Hsu
An artificial intelligence transformation model–pod redesign of photomasks in semiconductor manufacturing
Journal of Industrial and Production Engineering
2023/11/10
Chia-Yu Hsu
H-Index: 14
Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention
Computers & Industrial Engineering
2023/12/1
Chia-Yu Hsu
H-Index: 14
Temporal convolution-based long-short term memory network with attention mechanism for remaining useful life prediction
IEEE Transactions on Semiconductor Manufacturing
2022/4/6
Chia-Yu Hsu
H-Index: 14
Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification
Journal of Intelligent Manufacturing
2022/3
Chia-Yu Hsu
H-Index: 14
Key feature identification for monitoring wafer-to-wafer variation in semiconductor manufacturing
IEEE Transactions on Automation Science and Engineering
2022/1/17
Chia-Yu Hsu
H-Index: 14
Data visualization of anomaly detection in semiconductor processing tools
IEEE Transactions on Semiconductor Manufacturing
2021/12/23
Chia-Yu Hsu
H-Index: 14
Fei He
H-Index: 18
L-measure evaluation metric for fake information detection models with binary class imbalance
Enterprise Information Systems
2021/11/26
Applications of new industrial engineering methodologies
2021/9
Chia-Yu Hsu
H-Index: 14
Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing
Journal of Intelligent Manufacturing
2021/3
Chia-Yu Hsu
H-Index: 14
Corrigendum to “Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes”[Adv. Eng. Informat. 46 (2020) 101166](Advanced Engineering …
Advanced Engineering Informatics
2020/10
Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes
Advanced Engineering Informatics
2020/10/1
Chia-Yu Hsu
H-Index: 14
A new double exponentially weighted moving average run-to-run control using a disturbance-accumulating strategy for mixed-product mode
Quality and Reliability Engineering International
2022/6
An autoencoder gated recurrent unit for remaining useful life prediction
Processes
2020/9/15
Chia-Yu Hsu
H-Index: 14
A review on fault detection and process diagnostics in industrial processes
2020/9/9
Chia-Yu Hsu
H-Index: 14
A two-phase non-dominated sorting particle swarm optimization for chip feature design to improve wafer exposure effectiveness
Computers & Industrial Engineering
2020/9/1
Chia-Yu Hsu
H-Index: 14
Data-driven approach for fault detection and diagnostic in semiconductor manufacturing
International Journal of Electrical Power & Energy Systems
2012/12/1
Similarity matching of wafer bin maps for manufacturing intelligence to empower industry 3.5 for semiconductor manufacturing
Computers & Industrial Engineering
2020/4/1
Chia-Yu Hsu
H-Index: 14
