Cen Chen

About Cen Chen

Cen Chen, With an exceptional h-index of 8 and a recent h-index of 8 (since 2020), a distinguished researcher at Harbin Institute of Technology, specializes in the field of PHM of Power Electronics.

His recent articles reflect a diverse array of research interests and contributions to the field:

A reliability prediction method considering degradation self-acceleration effect in DC-link electrolytic capacitor

A modelling method of the on-state resistance of p-channel power MOSFETs under NBTI stress

Testability design of power distribution system considering noise immunity characteristics

A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling

Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas

Reliability analysis based on a bivariate degradation model considering random initial state and its correlation with degradation rate

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process

Reliability assessment of film capacitors oriented by dependent and nonlinear degradation considering three-source uncertainties

Cen Chen Information

University

Position

___

Citations(all)

276

Citations(since 2020)

245

Cited By

97

hIndex(all)

8

hIndex(since 2020)

8

i10Index(all)

5

i10Index(since 2020)

4

Email

University Profile Page

Google Scholar

Cen Chen Skills & Research Interests

PHM of Power Electronics

Top articles of Cen Chen

A reliability prediction method considering degradation self-acceleration effect in DC-link electrolytic capacitor

Quality Engineering

2024/1/2

A modelling method of the on-state resistance of p-channel power MOSFETs under NBTI stress

Microelectronics Reliability

2023/11/1

Testability design of power distribution system considering noise immunity characteristics

Microelectronics Reliability

2023/11/1

A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling

Reliability Engineering & System Safety

2022/12/1

Yifan Hu
Yifan Hu

H-Index: 5

Cen Chen
Cen Chen

H-Index: 4

Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas

Microelectronics Reliability

2022/11/1

Reliability analysis based on a bivariate degradation model considering random initial state and its correlation with degradation rate

IEEE Transactions on Reliability

2022/5/13

Cen Chen
Cen Chen

H-Index: 4

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process

Reliability Engineering & System Safety

2023/2/1

Reliability assessment of film capacitors oriented by dependent and nonlinear degradation considering three-source uncertainties

Microelectronics Reliability

2021/11/1

An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation

2021/5/17

Yun Yang
Yun Yang

H-Index: 13

Cen Chen
Cen Chen

H-Index: 4

Soft fault diagnosis using URV-LDA transformed feature dictionary

IEEE Access

2021/1/13

Cen Chen
Cen Chen

H-Index: 4

Yun Yang
Yun Yang

H-Index: 13

Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range

Quality and Reliability Engineering International

2021/11/26

Cen Chen
Cen Chen

H-Index: 4

An adaptive optimized TVF-EMD based on a sparsity-impact measure index for bearing incipient fault diagnosis

IEEE Transactions on Instrumentation and Measurement

2020/12/16

Yifan Hu
Yifan Hu

H-Index: 5

Cen Chen
Cen Chen

H-Index: 4

Life-cycle reliability design optimization of high-power DC electromagnetic devices based on time-dependent non-probabilistic convex model process

Microelectronics Reliability

2020/11/1

Life-cycle dynamic robust design optimization for batch production of permanent magnet actuator

IEEE Transactions on Industrial Electronics

2020/9/29

Hao Chen
Hao Chen

H-Index: 7

Cen Chen
Cen Chen

H-Index: 4

Condition-based maintenance optimization for motorized spindles integrating proportional hazard model with SPC charts

Mathematical Problems in Engineering

2020/7/21

Cen Chen
Cen Chen

H-Index: 4

Quality and robustness optimization design method for electromagnetic devices consider manufacturing uncertainties and working point migration of permanent magnets

SN Applied Sciences

2020/4

Hao Chen
Hao Chen

H-Index: 7

Cen Chen
Cen Chen

H-Index: 4

See List of Professors in Cen Chen University(Harbin Institute of Technology)

Co-Authors

academic-engine